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Surface Photovoltage Spectroscopy for the Investigation of Perovskite Oxide Interfaces

Published online by Cambridge University Press:  26 February 2011

Elke Beyreuther ,
Stefan Grafström ,
Christian Thiele ,
Kathrin Dörr  and
Lukas M. Eng
Elke Beyreuther
Affiliation:
elke@iapp.de, Dresden University of Technology, Institute of Applied Photophysics, George-Baehr-Strasse 1, Dresden, Saxony, D-01069, Germany
Stefan Grafström
Affiliation:
grafstro@iapp.de, Dresden University of Technology, Institute of Applied Photophysics, Germany
Christian Thiele
Affiliation:
C.Thiele@ifw-dresden.de, IFW Dresden, Institute for Metallic Materials, Germany
Kathrin Dörr
Affiliation:
K.Doerr@ifw-dresden.de, IFW Dresden, Institute for Metallic Materials, Germany
Lukas M. Eng
Affiliation:
eng@iapp.de, Dresden University of Technology, Institute of Applied Photophysics, Germany
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Abstract

In the present study, we comparatively investigate the distribution of electronic interface states of three different perovskite oxide interfaces, formed by epitaxial thin films of La0.7Sr0.3MnO3 (LSMO), La0.7Ca0.3MnO3 (LCMO), and La0.7Ce0.3MnO3 (LCeMO) on SrTiO3(100) substrates, in the as-prepared state as well as after an annealing procedure. We find that annealing significantly reduces the number and density of interface trap states. Two different experimental realizations of the surface photovoltage spectroscopy (SPS) technique were employed: an approach based on X-ray photoelectron spectroscopy (XPS), as well as a capacitive method. The advantages and limitations of both methods are critically discussed.

Keywords

photovoltaicdefectsfilm
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 902: Symposium T – Ferroelectric Thin Films XIII , 2005 , 0902-T07-05
Copyright
Copyright © Materials Research Society 2006

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