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Surface Phases of Metals on Silicon as Material for Surface Engineering

Published online by Cambridge University Press:  17 March 2011

Alexander A. Saranin
Affiliation:
Institute of Automation and Control Processes, FEB RAS, Vladivostok, Russia
Sergey V. Rizhkov
Affiliation:
Institute of Automation and Control Processes, FEB RAS, Vladivostok, Russia
Dmitriy A. Tsukanov
Affiliation:
Institute of Automation and Control Processes, FEB RAS, Vladivostok, Russia
Victor G. Lifshits
Affiliation:
Institute of Automation and Control Processes, FEB RAS, Vladivostok, Russia
Andrey V. Zotov
Affiliation:
Vladivostok State University, Vladivostok, Russia
Kenjiro Oura
Affiliation:
Department of Electronic Engineering, Osaka University, Suita, Osaka 565, Japan
Shuji Hasegawa
Affiliation:
Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Abstract

To study structural and transport properties of the surface phases on silicon, a number of adsorbate/silicon systems on Si(100) and Si(111) surfaces has been investigated using scanning tunneling microscopy (STM), reflection-high-energy-electron diffraction (RHEED) and in-situ electrical resistance measurements. Results of investigations of formation and electrical properties of Si-Al, Si-Na, Si-Ag and Si-In surface structure are presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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