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Study of The Homogeneity Of Cadmium Zinc Telluride Detectors

Published online by Cambridge University Press:  10 February 2011

H. Hermon ,
M. Schieber ,
N. Yang ,
R. B. James ,
N. N. P. Kolesnikov ,
Yu. N. Ivanov ,
V Komar ,
M. S. Goorsky ,
H. Yoon  and
J. Toney
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H. Hermon
Affiliation:
Sandia National Laboratories, Livermore, CA
M. Schieber
Affiliation:
Also at The Hebrew University of Jerusalem, Jerusalem, Israel
N. Yang
Affiliation:
Sandia National Laboratories, Livermore, CA
R. B. James
Affiliation:
Sandia National Laboratories, Livermore, CA
N. N. P. Kolesnikov
Affiliation:
Institute of Solid State Physics, Russian Academy of Sciences, Moscow, Russia
Yu. N. Ivanov
Affiliation:
Institute of Solid State Physics, Russian Academy of Sciences, Moscow, Russia
V Komar
Affiliation:
Institute for Single Crystals, National Academy of Science, Kharkov, Ukraine
M. S. Goorsky
Affiliation:
UCLA, Los Angeles, CA
H. Yoon
Affiliation:
UCLA, Los Angeles, CA
J. Toney
Affiliation:
Carnegie Mellon University, Pittsburgh, PA.
T. E. Schlesinger
Affiliation:
Carnegie Mellon University, Pittsburgh, PA.
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Abstract

Several analytical techniques have been used in the study of the homogeneity of Cadmium Zinc Telluride (CZT) single crystals grown by the vertical high pressure Bridgman (VHPB) method. The presence of black inclusions and tubular hollow pipes has been observed by a few methods, such as photoluminescence (PL), infrared (IR) transmission microscopy, scanning electron microscopy (SEM) and X-ray diffraction (XRD). The crystals investigated were grown commercially in the USA, at the Institute of Single Crystals in Kharkov, Ukraine, and at the Institute of Solid State Physics, Moscow, Russia. We discuss the homogeneity of the various CZT crystals based on the results from these measurement techniques.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 223
Copyright
Copyright © Materials Research Society 1998

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