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Structure of Sol-Gel Silic

Published online by Cambridge University Press:  22 February 2011

C. J. Brinker ,
R. K. Brow ,
D. R. Tallant  and
R. J. Kirkpatrick
C. J. Brinker
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-5800
R. K. Brow
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-5800
D. R. Tallant
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-5800
R. J. Kirkpatrick
Affiliation:
University of Illinois, Dept. of Geology, Urbana, IL 61801
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Abstract

Combined Raman, 29Si NMR and reactivity studies of silica gels indicate that dehydroxylation of the silica surface results in cyclotrisiloxane species with reduced Si-O-Si bond angles and altered acid/base characteristics. XPS experiments indicate that the expected 0.35 eV shifts in Si2p and O1s binding energies due to the reduced bond angles are hidden within broad peaks due to the remaining hydroxyls. Additional Si2P, OlS, and ClS peaks are also observed and are postulated to result from preferential adsorption of extrinsic C-containing species on sites with enhanced acid/base properties.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 105: Symposium F – SiO2 and Its Interfaces , 1987 , 289
Copyright
Copyright © Materials Research Society 1988

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References

1. Brinker, C. J., Keefer, K. D., Schaefer, D. W., and Ashley, C. S., J. Non-Cryst. Solids 48 47–64 (1982).CrossRefGoogle Scholar
2. Grunthaner, F. J., Grunthaner, P. J., Vasquez, R. P., Lewis, B. F., Maserjian, J., and Madhukar, A., Phys. Rev. Lett. 43 1683–1686 (1979).CrossRefGoogle Scholar
3. Brinker, C. J., Tallant, D. R., Roth, E. P., and Ashley, C. S., J. Non-Cryst. Solids 82 117 (1986).CrossRefGoogle Scholar
4. Brinker, C. J., Kirkpatrick, R. J., Tallant, D. R., Bunker, B. C., and Montez, B., J. Non-Cryst Solids in press.Google Scholar
5. see, e. g. Galeener, F. L. and Wright, A. C., Solid St. Comm. 57 677 (1986).CrossRefGoogle Scholar
6. Sindorf, D. W. and Macill, G. E., J. Am. Chem. Soc. 105 1487 (1983).CrossRefGoogle Scholar
7. Fyfe, C. A., Solid State NMR for Chemists, (C.F.C. Press Guelph, Ontario 1983).Google Scholar
8. Miller, M. L. and Linton, R. W., Anal. Chem. 57 2314–2319 (1985).CrossRefGoogle Scholar
9. Iqbal, A., Bates, C. W. Jr. and Allen, J. W., Appl. Phys. Lett. 47 1064–1066 (1985).CrossRefGoogle Scholar
10. Oestrike, R., Yang, W.-H., Kirkpatrick, R. J., Hervig, R. L., Navrotsky, A., and Montez, B., Geochim. Cosmochim. Acta 51 2199 (1987).CrossRefGoogle Scholar
11. O'Keffe, M. and Gibbs, G. V., J. Chem. Phys. 81 876 (1984).CrossRefGoogle Scholar
12. Galeener, F. L., Solid St. Comm. 44 1037 (1982).CrossRefGoogle Scholar
13. MO calculations of (HO) 6Si2O at the 6–31G level indicate that the negative charge on the bridging oxygen increases from -0.88 to -0.945 as the Si-O-Si angle decreases from 170° to 120°, G. V. Gibbs, private communication, 1987.Google Scholar
14. Boudjonk, P., Kapfer, C. A. and Cunico, R. F., Organometallics 2 336 (1983).CrossRefGoogle Scholar
15. Michalske, T. A. and Bunker, B. C., J. Appl. Phys. 56 2686 (1984).CrossRefGoogle Scholar
16. Devine, R. A., J. Appl. Phys. 60 468–470 (1986).CrossRefGoogle Scholar
17. Janes, N. and Oldfield, E., J. Am. Chem. Soc. 107 6769 (1985).CrossRefGoogle Scholar
18. Grunthaner, F. J., Mat. Sci. Rpts. 1 (1986) 65.CrossRefGoogle Scholar
19. Hollinger, G., Bergignat, E., Chermette, H., Himpsel, F., Lohez, D., Lannoo, M., and Bensoussan, M., Phil. Mag. B55 735 (1987).CrossRefGoogle Scholar
20. Brinker, C. J., Tallant, D. R., Roth, E. P., and Ashley, C. S., Mat. Res. Soc. Symp. Proc. 61 (1986) 387.CrossRefGoogle Scholar
21. DeMayo, P., Natarajan, L. V., and Ware, W. R. Am. Chem. Soc. Symp. Series 278 1 (1985).CrossRefGoogle Scholar