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Structure and Morphology of PD Overlayers on Epitaxial SNO2 Films Studied with the Atomic Force Microscope

Published online by Cambridge University Press:  25 February 2011

R. J. Lad ,
M. J. Matthews ,
M. D. Antonik ,
R. E. Cavicchi  and
S. Semancik
R. J. Lad
Affiliation:
Laboratory for Surface Science & Technology, 5764 Sawyer Research Center, University of Maine, Orono, ME 04469–5764
M. J. Matthews
Affiliation:
Laboratory for Surface Science & Technology, 5764 Sawyer Research Center, University of Maine, Orono, ME 04469–5764
M. D. Antonik
Affiliation:
Laboratory for Surface Science & Technology, 5764 Sawyer Research Center, University of Maine, Orono, ME 04469–5764
R. E. Cavicchi
Affiliation:
Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899
S. Semancik
Affiliation:
Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899
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Abstract

The structure and morphology of clean and Pd-doped epitaxial SnO2 films were studied with the atomic force microscope (AFM). The SnO2 films were grown by reactive sputter deposition on three different substrates yielding epitaxial orientations: (101) SnO2 / r-cut sapphire, (100) SnO2 / basal sapphire, and (110) SnO2 / TiO2 (110). AFM imaging of monolayer amounts of Pd deposited onto the epitaxial SnO2 films shows that the Pd is dispersed at 300 K and forms clusters after annealing to 500 K in vacuum.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 280: Symposium B – Evolution of Surface and Thin Film Microstructure , 1992 , 641
Copyright
Copyright © Materials Research Society 1993

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References

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