Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-25T00:24:02.097Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural dynamics of PZT thin films at the nanoscale

Published online by Cambridge University Press:  26 February 2011

Alexei Grigoriev ,
Dal-Hyun Do ,
Dong Min Kim ,
Chang-Beom Eom ,
Bernhard Adams ,
Eric M. Dufresne  and
Paul G. Evans
Alexei Grigoriev
Affiliation:
alexey@cae.wisc.edu, University of Wisconsin - Madison, 1509 University Avenue, Madison, WI, 53706, United States, 608-262-7433
Dal-Hyun Do
Affiliation:
ddo@cae.wisc.edu, University of Wisconsin - Madison, United States
Dong Min Kim
Affiliation:
dmkim@engr.wisc.edu, University of Wisconsin - Madison, United States
Chang-Beom Eom
Affiliation:
eom@engr.wisc.edu, University of Wisconsin - Madison, United States
Bernhard Adams
Affiliation:
adams@aps.anl.gov, Argonne National Laboratory, United States
Eric M. Dufresne
Affiliation:
dufresne@anl.gov, Argonne National Laboratory, United States
Paul G. Evans
Affiliation:
evans@engr.wisc.edu, University of Wisconsin - Madison, United States
Get access

Abstract

When an electric field is applied to a ferroelectric the crystal lattice spacing changes as a result of the converse piezoelectric effect. Although the piezoelectric effect and polarization switching have been investigated for decades there has been no direct nanosecond-scale visualization of these phenomena in solid crystalline ferroelectrics. Synchrotron x-rays allow the polarization switching and the crystal lattice distortion to be visualized in space and time on scales of hundreds of nanometers and hundreds of picoseconds using ultrafast x-ray microdiffraction. Here we report the polarization switching visualization and polarization domain wall velocities for Pb(Zr0.45Ti0.55)O3 thin film ferroelectric capacitors studied by time-resolved x-ray microdiffraction.

Keywords

ferroelectricityx-ray diffraction (XRD)nanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 902: Symposium T – Ferroelectric Thin Films XIII , 2005 , 0902-T06-09
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Merz, W. J., Phys. Rev 117, 1460 (1960).Google Scholar
2 Bartels, L., Wang, F., Moeller, D., Knoesel, E., Heinz, T. F., Science 305, 648 (2004).Google Scholar
3 Lindenberg, A. M. et al. Science 308, 392 (2005).Google Scholar
4 Do, D.-H. et al. Nature Mater. 3, 365 (2004).Google Scholar
5 Spiller, E. et al. Science 191, 1172 (1976).Google Scholar
6 Suzuki, Y., Takeuchi, A., Takano, H., Takenaka, H., Jpn. J. Appl. Phys 44, 1994 (2005).Google Scholar
7 Gruverman, A. et al. Appl. Phys. Lett 87, 082902 (2005).Google Scholar
8 Jung, D. J., Kim, K., Scott, J. F., J. Phys.: Condens. Matter 17, 4843 (2005).Google Scholar
9 Chen, L., Nagarajan, V., Ramesh, R., Roytburd, A. L., J. Appl. Phys. 94, 5147 (2003).Google Scholar