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Structural Defects in Thin Films Of High TC Superconductors

Published online by Cambridge University Press:  28 February 2011

R. Ramesh
Affiliation:
Bellcore, Red Bank, NJ 07701.
D.M. Hwang
Affiliation:
Bellcore, Red Bank, NJ 07701.
P. England
Affiliation:
Bellcore, Red Bank, NJ 07701.
T.S. Ravi
Affiliation:
Bellcore, Red Bank, NJ 07701.
C.Y. Chen
Affiliation:
Bellcore, Red Bank, NJ 07701.
A. Inam
Affiliation:
Rutgers University, Piscataway, NJ
B. Dutta
Affiliation:
Middlebury College, Vermont, VT.
L. Nazar
Affiliation:
Bellcore, Red Bank, NJ 07701.
T. Venkatesan
Affiliation:
Bellcore, Red Bank, NJ 07701.
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Abstract

In this short report, we describe some of the structural defects present in laser deposited Y‐Ba‐Cu‐O thin films. Many of the defects observed are polytypoidic variants, related to the layered structure of these cuprates. One possible model by which flux pinning can be achieved is presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1 Campbell, A.M. and Evetts, J.E., Critical currents in superconductors”, Taylor and Francis monographs on Physics, Eds. Coles, B.R. and Mott, N.F., Barnes and Noble Books, New York, 1972.Google Scholar
2 Ramesh, R. et al. , Science, in press.Google Scholar
3 Ramesh, R. et al. submitted to Jl. of Materials Research; L.A.Teitz et. al., Jl. of Materials Research, 4,1072(1989).Google Scholar
4 Dutta, B., Wu, X.D., Inam, A. and Venkatesan, T., Solid State Technology,32,106(1989).Google Scholar