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Structural and Spectroscopic Study of Langmuir-Schäfer Films of Bis Zn-Ethane-Bridged Porphyrins Dimer

Published online by Cambridge University Press:  15 February 2011

G. Panzera ,
S. Conoci ,
S. Coffa ,
B. Pignataro ,
S. Sortino ,
L. Valli ,
V.V. Borovkov  and
Y. Inoue
G. Panzera
Affiliation:
Si optoelectronics, bio-and nano-systems, Corporate Technology R&D, ST Microelectronics, Stradale Primosole 50, I-95125 Catania, Italy
S. Conoci
Affiliation:
Si optoelectronics, bio-and nano-systems, Corporate Technology R&D, ST Microelectronics, Stradale Primosole 50, I-95125 Catania, Italy
S. Coffa
Affiliation:
Si optoelectronics, bio-and nano-systems, Corporate Technology R&D, ST Microelectronics, Stradale Primosole 50, I-95125 Catania, Italy
B. Pignataro
Affiliation:
Dipartimento di Scienze Chimiche, Università di Catania, Viale A. Doria 95125 Catania, Italy
S. Sortino
Affiliation:
Dipartimento di Scienze Chimiche, Università di Catania, Viale A. Doria 95125 Catania, Italy
L. Valli
Affiliation:
Dipartimento Ingegneria dell'Innovazione, Università di Lecce, Via Monteroni 73100 Lecce, Italy
V.V. Borovkov
Affiliation:
Inoue Photochirogenesis Project, ERATO, JST, 4-6-3, Kamishinden, Toyonaka-shi, Osaka 560-0085, Japan
Y. Inoue
Affiliation:
Inoue Photochirogenesis Project, ERATO, JST, 4-6-3, Kamishinden, Toyonaka-shi, Osaka 560-0085, Japan
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Abstract

Thin films (1-24 layers) of bis-zinc ethane-bridged porphyrin dimer (1) have been transferred on solid surfaces, by the Langmuir- Schäfer (LS) horizontal method. The related surface pressurearea isotherm curve shows that in dependence of the film pressure different condensed phases may occur in the monolayer. The inspection of the monolayer by Brewster Angle Microscopy (BAM) reveals the presence of peculiar networks whose structural features seemingly change upon film compression. On the other hand, the Scanning Force Microscopy (SFM) analysis performed on LS films shows fractal networks constituted by nanoscopic supramolecular aggregates, whose shape and size depend again on the LS deposition surface pressure. Finally, also UV-vis spectroscopy measurements indicates that the absorption is almost linearly related to the film thickness that is directly connected to the surface pressure.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 771: Symposium L – Organic and Polymeric Materials and Devices , 2003 , L7.29
Copyright
Copyright © Materials Research Society 2003

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References

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