Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-27T04:51:45.529Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural and Electronic Properties of Self-Assembled Supramolecular Grid Structures: Doping of Supramolecular Thin Films

Published online by Cambridge University Press:  10 February 2011

J. Hassmann ,
C. Y. Hahn ,
O. Waldmann ,
E. Volz ,
H-J. Schleemilch ,
N. Hallschmid ,
P. MÜller ,
G. S. Hanan ,
D. Volkmer  and
U. S. Schubert
...Show all authors
J. Hassmann
Affiliation:
Physikalisches Institut III, Universitait Erlangen-Nürnberg, 91058 Erlangen, Germanyhassmann@physik.uni-erlangen.de
C. Y. Hahn
Affiliation:
Physikalisches Institut III, Universitait Erlangen-Nürnberg, 91058 Erlangen, Germanyhassmann@physik.uni-erlangen.de
O. Waldmann
Affiliation:
Physikalisches Institut III, Universitait Erlangen-Nürnberg, 91058 Erlangen, Germanyhassmann@physik.uni-erlangen.de
E. Volz
Affiliation:
Physikalisches Institut III, Universitait Erlangen-Nürnberg, 91058 Erlangen, Germanyhassmann@physik.uni-erlangen.de
H-J. Schleemilch
Affiliation:
Physikalisches Institut III, Universitait Erlangen-Nürnberg, 91058 Erlangen, Germanyhassmann@physik.uni-erlangen.de
N. Hallschmid
Affiliation:
Physikalisches Institut III, Universitait Erlangen-Nürnberg, 91058 Erlangen, Germanyhassmann@physik.uni-erlangen.de
P. MÜller
Affiliation:
Physikalisches Institut III, Universitait Erlangen-Nürnberg, 91058 Erlangen, Germanyhassmann@physik.uni-erlangen.de
G. S. Hanan
Affiliation:
Université Louis Pasteur, 4 rue Blaise Pascal, 67000 Strasbourg, France
D. Volkmer
Affiliation:
Université Louis Pasteur, 4 rue Blaise Pascal, 67000 Strasbourg, France
U. S. Schubert
Affiliation:
Université Louis Pasteur, 4 rue Blaise Pascal, 67000 Strasbourg, France
J-M. Lehn
Affiliation:
Université Louis Pasteur, 4 rue Blaise Pascal, 67000 Strasbourg, France
H. Mauser
Affiliation:
Institut für Organische Chemie, Universitdät Erlangen-Ntirnberg, Henkestr. 42, 91058 Erlangen, Germany
A. Hirsch
Affiliation:
Institut für Organische Chemie, Universitdät Erlangen-Ntirnberg, Henkestr. 42, 91058 Erlangen, Germany
T. Clark
Affiliation:
Institut für Organische Chemie, Universitdät Erlangen-Ntirnberg, Henkestr. 42, 91058 Erlangen, Germany
Get access

Abstract

Thin films of self-assembled supramolecular grid structures were prepared by electrochemical deposition. The surface structure of the films was determined by electrochemical insitu scanning tunneling microscopy (STM), revealing ordered monolayers of the grid molecules on a Au( 111) surface. The electronic structure of the films was studied by photoelectron spectroscopy. The thin films show semiconducting behavior with an insulating gap of ca. 2.5 eV. The size of insulating gap can be reduced to 0.5 eV by doping the films with additional Cd2+ ions, which is in agreement with molecular orbital calculations. Additionally, conductivity measurements were performed. By doping of the thin films, their conductivity could be increased by several orders of magnitude. This is due to additional electronic states in the insulating HOMO-LUMO gap, which is confirmed by UPS measurements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 488: Symposium J – Electrical, Optical & Magnetic Properties of Organic IV , 1997 , 447
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lehn, J.-M., Supramolecular Chemistry- Concepts and Perspectives, VCH, Weinheim, 1995, pp. 89–139.Google Scholar
2. Scott, J.H., Yip, C.M., Ward, M.D., Langmuir 11, 177 (1995).Google Scholar
3. Tao, N.J., DeRose, J.A., Lindsay, S.M., J. Phys. Chem 97, 910 (1993).Google Scholar
4. Chen, C., Versecky, S.M., Gewirth, A.A., J. Am. Chem. Soc. 114, 451 (1992).Google Scholar
5. Soldatov, E.S., Khanin, V.V., Trifonov, A.S., Presnov, D.E., Yakovenko, S.A., Khomutov, G.B., Gubin, C.P., Kholesov, V.V., JETP Lett. 64, 556 (1996).Google Scholar
6. Waldmann, O., Hassmann, J., Müller, P., Hanan, G.S., Volkmer, D., Schubert, U.S., Lehn, J.-M., Phys. Rev. Lett. 78, 3390 (1997).Google Scholar
7. Hanan, G.S., Schubert, U.S., Volkmer, D., Lehn, J.-M., Hassmann, J., Hahn, C.Y., Waldmann, O., Müller, P., Baum, G., Fenske, D. in 9thInternationl Symposium on Molecular Recognition and Inculusion, edited by A. Colman, Kluwer Academic Press, in press.Google Scholar
8. Hanan, G.S., Arana, C.R., Lehn, J.-M., Fenske, D., Angew. Chem. 107, 1191 (1995).Google Scholar
9. Hanan, G.S., Schubert, U.S., Volkmer, D., Lehn, J.-M., Baum, G., Fenske, D., Angew. Chem. 109, 1929 (1997).Google Scholar
10. Rauhut, G., Alex, A., Chandrasekhar, J., Steinke, T., Sauer, W., Beck, B., Hutter, M., Gedeck, P., Clark, T., VAMP 6.1, Oxford Molecular Ltd., Madwar Centre, Oxford Science Park, Standford-on-Thames, England, 1996.Google Scholar
11. Stewart, J.J., J. Comput. Chem. 10, 209 (1989).Google Scholar
12. Hassmann, J., Volz, E., Schleemilch, H.-J., Müller, P., Volkmer, D., Hanan, G.S., Lehn, J.-M., Mauser, H., Hirsch, A., Johnson, R.L., to be published.Google Scholar