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Standing Wave Reflectivity in Photonic Structures Using a Scattering Type Optical Near-Field Optical Microscope

Published online by Cambridge University Press:  01 February 2011

A. Bruyant ,
S. Aubert ,
G. Lérondel ,
S. Blaize ,
R. Bachelot ,
P. Royer  and
V. Minier
A. Bruyant
Affiliation:
Laboratoire de Nanotechnologie et Instrumentation Optique, UTT - CNRS (FRE 2671), 10010 TROYES cedex, France
S. Aubert
Affiliation:
Laboratoire de Nanotechnologie et Instrumentation Optique, UTT - CNRS (FRE 2671), 10010 TROYES cedex, France
G. Lérondel
Affiliation:
Laboratoire de Nanotechnologie et Instrumentation Optique, UTT - CNRS (FRE 2671), 10010 TROYES cedex, France
S. Blaize
Affiliation:
Laboratoire de Nanotechnologie et Instrumentation Optique, UTT - CNRS (FRE 2671), 10010 TROYES cedex, France
R. Bachelot
Affiliation:
Laboratoire de Nanotechnologie et Instrumentation Optique, UTT - CNRS (FRE 2671), 10010 TROYES cedex, France
P. Royer
Affiliation:
Laboratoire de Nanotechnologie et Instrumentation Optique, UTT - CNRS (FRE 2671), 10010 TROYES cedex, France
V. Minier
Affiliation:
Groupement d'Electromagnétisme Expérimental et d'Optoélectronique, 38240 Meylan, France
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Abstract

A method for measuring locally the normalised reflectivity spectrum in waveguiding photonic structures is presented. The latter is obtained by imaging the standing wave pattern upstream of the structure with a scattering type Scanning Near-field Optical Scanning Microscope (s-SNOM) and normalised with a simple Fourier analysis. Two kinds of sample are investigated. The first one is a corrugated integrated waveguide, the second is a fiber Bragg grating. The s-SNOM technique applied to waveguiding structures is first introduced with the case of a straight waveguide.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 797: Symposium W – Engineered Porosity for Microphotonics and Plasmonics , 2003 , W4.8
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

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