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Sreels Analysis of Oxygen-Rich Inversion Domain Boundaries in Aluminum Nitride

Published online by Cambridge University Press:  15 February 2011

J. Bruley
Affiliation:
Department of Materials Science& Engineering, Lehigh University, Bethlehem, PA
A.D. Westwood
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY
R. A. Youngman
Affiliation:
Carborundum Co., Phoenix, AZ
J.-C. Zhao
Affiliation:
Department of Materials Science& Engineering, Lehigh University, Bethlehem, PA
M.R. Notis
Affiliation:
Department of Materials Science& Engineering, Lehigh University, Bethlehem, PA
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Abstract

Spatially resolved electron energy loss spectroscopy analysis has been conducted on planar inversion domain boundaries in aluminum nitride. The defects were found to contain 1.5 monolayers of oxygen, in agreement with the most recent structural model of Westwood. From variations in near-edge structure, the local atomic environments of both oxygen and aluminum are compared with α-A1203, γ-A1203 and γ-AION standards. Based upon this study the stnrcture of the inversion domain boundary is found to resemble that of the cubic γ-AION spinel, and eliminates from consideration those structural models based upon ai-Al203. Furthermore, quantification of the shape resonances provided Al-O bond-length data from the inversion domain boundary interface. These distances closely agree with the Youngman Model that has recently been further refined by Westwood et al.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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