Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-06-23T06:57:21.283Z Has data issue: false hasContentIssue false

Space Charge Effects Due to Near Contact Non-Uniform Electric Fields in Semi-Insulating GaAs

Published online by Cambridge University Press:  21 February 2011

Narbeh Derhacobian
Affiliation:
University of California, Los Angeles, Dept. of Physics, Los Angeles, CA, 90024
Nancy M. Haegel
Affiliation:
University of California, Los Angeles, Dept. of Materials Science and Engineering, Los Angeles, CA, 90024
Get access

Abstract

Variable length semi-insulating GaAs p+-υ-n+ diodes are used to investigate the influence of near contact electric field non-uniformities on the injection of minority carriers. The results show that despite the presence of highly linear IV characteristics, significant nonuniformities in the electric field dominate the device response. The current density through the device is shown to depend on the device length with a power law J ∞ (L)1.0 at a constant bias. The experimental results are compared, with good agreement, to a theoretical model which treats semi-insulating GaAs as a trap-dominated relaxation semiconductor. Electroabsorption measurements are used to observe the slow transients associated with the appearance of near contact field nonuniformities.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[l] Garmire, E.,et al, J. Opt. Soc. Amr B 6 p.579 (1989).CrossRefGoogle Scholar
[2] Glass, A.M.in Photorefractive Materials and 7heir Applications, edited by Gunter, P. and Huginard, J. (Springer-Verlag, Berlin 1988).Google Scholar
[3] Henisch, H.K., Semiconductor Contacts (Oxford University Press, NewYork 1984).Google Scholar
[4] Derhacobian, N.,et al, submitted to J. Appl. Phys. 1992.Google Scholar
[5] Manifacier, J.C.,Henisch, H.K., J. Appl. Phys. 52 p.5195 (1981).Google Scholar
[6] Cavicchi, B.T.,Haegel, N.M., Phys. Rev. Lett. 63 p. 195 (1990).CrossRefGoogle Scholar
[7] Derhacobian, N., Haegel, N.M., Phys. Rev. B 44, p 12754 (1991).Google Scholar
[8] Derhacobian, N., PhD Thesis, UCLA,Dept. of Phys., 1992.Google Scholar
[9] Pantelides, S., Deep Centers in Semiconductors (Gordon and Breach Scientific, New York, 1986).Google Scholar
[10] Stillman, G.E. and Wolf, C.M. in Semiconductors and Semimetals vol.9 (Academic Press, New York, 1977).Google Scholar