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Small-angle x-ray scattering characterization of self-irradiated zircon

Published online by Cambridge University Press:  01 February 2011

Susana Ríos  and
Ekhard K. H. Salje
Susana Ríos
Affiliation:
Department of Earth Sciences, University of Cambridge, Downing Street, Cambridge CB2 3EQ, United Kingdom
Ekhard K. H. Salje
Affiliation:
Department of Earth Sciences, University of Cambridge, Downing Street, Cambridge CB2 3EQ, United Kingdom
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Abstract

Small-angle x-ray scattering (SAXS) measurements were performed on two natural zircons: one with an amorphous content close to 85 %, and the second one x-ray amorphous. Electron density fluctuations were observed in the untreated samples, and studied as a function of various heat-treatments. In the starting material, density fluctuations were found to have a characteristic length-scale of approximately 1 nanometer diameter. Below 800 °C, the SAXS contribution (Q<10 nm-1) showed only a small variation as a function of temperature. Above 800 °C, a strong increase in intensity is observed, accompanied by the precipitation of 2–3 nm zirconia domains. At high enough temperatures, >1000 °C, when the amorphous phase recrystallizes into the starting zircon structure, characteristics of surface-scattering are observed, associated to large zircon regions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 792: Symposium R – Radiation Effects and Ion Beam Processing of Materials , 2003 , R3.33
Copyright
Copyright © Materials Research Society 2004

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References

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