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Si/SiGe and III-V Integrated Circuit Technology for Next Generation High-Speed Systems: Comparisons and Tradeoffs

Published online by Cambridge University Press:  10 February 2011

Lawrence E. Larson*
Affiliation:
Department of Electrical and Computer Engineering, University of California - San Diego, 9500 Gilman Drive, La Jolla, CA 92093, e-mail:, larson@ece.ucsd.edu
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Abstract

This paper will summarize the technology tradeoffs that are involved in the implementation of high-speed integrated circuit technology for communications applications. The advantages of Si/SiGe and III-V technology with respect to CMOS and Si bipolar technologies are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

[1] Nguyen, L., Larson, L., and Mishra, U., ”Ultra-high-speed modulation-doped field-effect transistors: a tutorial overview, Proc. of the IEEE, vol.80, no. 4, April, 1992, pp. 494518.Google Scholar
[2] Kobayashi, K., et. al., ”An InP HEMT W-Band amplifier with monolithically integrated HBT bias regulation,” IEEE Microwave and Guided Wave Letters, vol.7, pp. 222224, 1997.Google Scholar
[3] Matts Carlson, IEEE GaAs IC Symp. Short Course Notes, 1996.Google Scholar
[4] Ismail, K., Arafa, M., Saenger, K., Chu, J., and Meyerson, B., ”Extremely high electron mobility in Si/SiGe modulation-doped heterostructures,” Applied Physics Letters, vol.66, no. 9, Feb., 1995, pp. 10771079.Google Scholar
[5] Hughes, B., ”A temperature noise model for extrinsic FETs,” IEEE Transactions on Microwave Theory and Techniques, vol.40, no. 9, Sept. 1992, pp. 18211832.Google Scholar
[6] Houussaye, P. de la, Chang, C., Offord, B., Imthurn, G., Johnson, R., Asbeck, P. and Lagnado, I., ”Microwave performance of optically fabricated T-gate thin-film silicon-on-sapphire based MOSFETs,” IEEE Electron Device Letters, vol.16, no. 6, June, 1995, pp. 289292.Google Scholar
[7] Konig, U., Gruhle, A., and Schuppen, A., “SiGe devices and circuits: where are the advantages over III-V/,” Proc. 1995 IEEE GaAs IC Symposium, pp. 1418.Google Scholar
[8] Nelson, B., Cripps, S., Kenney, J., and Podell, A., ”A high-efficiency single-supply RFIC PHS linear power amplifier with low adjacent channel power leakage,” in 1996 IEEE MTT Symp. Dig., San Fransisco, CA, pp. 4952.Google Scholar
[9] Johnson, E.Q., ”Physical limitation on frequency and power parameters of transistors,” IEEE Intern. Conv. record, pt. 5, p. 27, 1965.Google Scholar
[10] Su, D. and McFarland, W., “A 2.5V, 1-W Monolithic CMOS RF power Amplifier,” Proc. 1997 CICC, May, 1997, pp. 189192.Google Scholar
[11] Trew, R., et. al., ”High-power applications for GaN-based devices,” Solid-State Electronics, vol. 41, no. 10, pp. 15611567.Google Scholar
[12] Eastman, L., et. al, “Design, fabrication, and characterization of GaN-based HFETs,” 1997 Advanced Workshop on Frontiers in Electronics, WOFE, '97, Jan. 1997.Google Scholar
[13] Trew, R. et. al, ”High-frequency, high temperature field-effect transistors fabricated from wide bandgap semiconductors,” International Journal of High Speed Electronics and Systems, vol. 6, no. 1, March, 1995, pp. 211236.Google Scholar
[14] Greenberg, D., et. al, “Large-signal performance of high BVceo graded epi-base SiGe HBTs at wireless frequencies,” Proc. 1997 IEDM, pp. 799802.Google Scholar
[15] Streit, D., et. al. “Production and commercial insertion of InP HBT integrated circuits,” Proc. IEEE 1997 GaAs IC Symposium, pp. 135138.Google Scholar
[16] Carson, R. S., Radio Communications Concepts: Analog , John Wiley and Sons, 1990 Google Scholar
[17] Karanicolas, A., “A 2.7V 900 MHz CMOS LNA and Mixer,” Int. Solid-State Circuits Conf. 1996, pp. 5051.Google Scholar
[18] Long, J. and Copeland, M., ”A 1.9 GHz low-voltage silicon bipolar receiver front-end for wireless personal communications systems,” IEEE JSSC, vol.30, no. 12, 1995, pp. 14381448.Google Scholar
[19] Takeuchi, H., Murakoa, M., Hatakeyama, T., Matsuoka, A., and Miyazaki, S., “A Si wide-band MMIC amplifier family for L-S band consumer product applications,” 1991 IEEE MTT Symp. Dig. 12831284.Google Scholar
[20] Long, J., Copeland, M., Kovacic, S., Malhi, D., and Harame, D., “RF analog and digital circuits in SiGe technology,” Int. Solid-State Circuits Conf., 1996, pp. 8283.Google Scholar
[21] Cioffi, K., “Monolithic L-band amplifiers operating at milliwatt and sub-milliwatt dc power consumptions,” 1992 IEEE MMWMCS Dig., pp. 912.Google Scholar
[22] Hara, S., ““Miniature low-noise variable MMIC amplifiers with low power consumption for L-band portable communications application,”,” in 1991 IEEE MTT Symp. Dig., Atlanta, GA, pp. 6770.Google Scholar
[23] Kobayashi, K., Umemoto, D., Block, T., Oki, A., and Streit, D., ” Ultra-low dc power GaAs HBT S- and C-band low-noise amplifiers for portable wireless communications,” IEEE Trans. MTT, vol.43, no. 12, 1995, pp. 30553061.Google Scholar
[24] Maas, S., Nelson, B., and Tait., D., ”Intermodulation in heterojunction bipolar transistors,” IEEE Trans. MTT, vol.40, no. 3, 1992, pp. 442447.Google Scholar
[25] Harame, D., Meyerson, B., Larson, L., and Cunningham, P., “Epi-Base BJT vs. Epi-Base HBT, private communications,” 1995.Google Scholar
[26 ] Case, M., et. al, “A 26 GHz digital frequency divider implemented in a manufacturable Si/SiGe HBT technology,” Proc. 1995 IEEE BCTM, 1995.Google Scholar
[27] Glenn, J., et. al, “12-Ghz Gilbert mixers using a manufacturable Si/SiGe epitaxial-base bipolar technology,” Proc. 1995 IEEE BCTM, pp. 186189.Google Scholar
[28] Henderson, G., et. al, “SiGe bipolar transistors for microwave power applications,” 1997 IEEE MTT-S International Microwave Symposium digest, pp. 12991302.Google Scholar
[29] Larson, L., et. al., “A low-cost monolithic microwave integrated circuit technology in Si/SiGe HBT technology,” Proc. 1996 IEEE Intl. Solid-state Circuits Conf. Pp. 8889.Google Scholar
[30] Hafizi, M. et. al., “Ultra-fast low-power integrated circuits in a scaled submicron HBT IC technology,” 1997 Radio Frequency Integrated Circuits Symposium, pp. 64–7.Google Scholar