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Scanning Force Microscope Studies of Detachment of Nanometer Adhering Particulates

Published online by Cambridge University Press:  10 February 2011

J. T. Dickinson ,
R. F. Hariadi ,
L. Scudiero  and
S. C. Langford
J. T. Dickinson
Affiliation:
Department of Physics and Materials Science Program, Washington State University Pullman, WA 99164–2814, jtd@wsu.edu
R. F. Hariadi
Affiliation:
Department of Physics and Materials Science Program, Washington State University Pullman, WA 99164–2814, jtd@wsu.edu
L. Scudiero
Affiliation:
Department of Physics and Materials Science Program, Washington State University Pullman, WA 99164–2814, jtd@wsu.edu
S. C. Langford
Affiliation:
Department of Physics and Materials Science Program, Washington State University Pullman, WA 99164–2814, jtd@wsu.edu
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Abstract

We employ salt particles deposited on soda lime glass substrates as a model system for particle detachment in chemically active environments. The chemical activity is provided by water vapor, and detachment is performed with the tip of a scanning force microscope. The later force required to detach nanometer-scale salt particles is a strong function of particle size and relative humidity. The peak lateral force at detachment divided by the nominal particle area yields an effective interfacial shear strength. The variation of shear strength with particle size and humidity is described in terms of chemically assisted crack growth along the salt-glass interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 566: Symposium P – Chemical-Mechanical Poilshing-Fundamentals and Challenges , 1999 , 273
Copyright
Copyright © Materials Research Society 2000

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References

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