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Reliability of Linbo. Based Integrated Optical Waveguide Devices for Fiber Communication Systems

Published online by Cambridge University Press:  10 February 2011

Hirotoshi Nagata ,
Naoki Mitsugi ,
Kaoru Higuma ,
Junichiro Ichikawa ,
Toshihiro Sakamoto ,
Tetsuya Fujino  and
Takashi Shinriki
Hirotoshi Nagata
Affiliation:
Optoelectronics Research Group, New Technology Research Laboratory, Sumitomo Osaka Cement Co., Ltd., 585 Toyotomi-cho, Funabashi-shi, Chiba 274-8601, Japan
Naoki Mitsugi
Affiliation:
Optoelectronics Research Group, New Technology Research Laboratory, Sumitomo Osaka Cement Co., Ltd., 585 Toyotomi-cho, Funabashi-shi, Chiba 274-8601, Japan
Kaoru Higuma
Affiliation:
Optoelectronics Research Group, New Technology Research Laboratory, Sumitomo Osaka Cement Co., Ltd., 585 Toyotomi-cho, Funabashi-shi, Chiba 274-8601, Japan
Junichiro Ichikawa
Affiliation:
Optoelectronics Research Group, New Technology Research Laboratory, Sumitomo Osaka Cement Co., Ltd., 585 Toyotomi-cho, Funabashi-shi, Chiba 274-8601, Japan
Toshihiro Sakamoto
Affiliation:
Optoelectronics & Electronics Division, Sumitomo Osaka Cement Co., Ltd.,585 Toyotomi-cho, Funabashi-shi, Chiba 274–8601, Japan
Tetsuya Fujino
Affiliation:
Optoelectronics & Electronics Division, Sumitomo Osaka Cement Co., Ltd.,585 Toyotomi-cho, Funabashi-shi, Chiba 274–8601, Japan
Takashi Shinriki
Affiliation:
Optoelectronics & Electronics Division, Sumitomo Osaka Cement Co., Ltd.,585 Toyotomi-cho, Funabashi-shi, Chiba 274–8601, Japan
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Abstract

Increasing demands for LiNbO3 (LN) optical waveguide devices installed into submarine and terrestrial fiber communication systems necessitate that high quality and long-term reliability (over 20 years) be established. In addition to general requirements for reliability in electrooptical devices, the LN devices need to assure of the dc-drift phenomena in the optical output signal. The dc-drift is caused by the complex electrical nature of constituent device materials; i.e. LN substrates and SiO2 buffer layers on LN. Results of theoretical and experimental investigations of the suppression of dc-drift are applied to the design of practical LN devices, and the devices have been in service for 4 years, as of this moment, without any failure. Here, problems on the dc-drift are discussed from the viewpoints of device reliability and actual fabrication processes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 531: Symposium DD – Reliabilty of Photonics Materials & Structures , 1998 , 359
Copyright
Copyright © Materials Research Society 1998

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