Hostname: page-component-848d4c4894-pjpqr Total loading time: 0 Render date: 2024-06-20T02:15:35.652Z Has data issue: false hasContentIssue false
  • English
  • Français

Relating Polymer Indentation Behavior to Elastic Modulus Using Atomic Force Microscopy

Published online by Cambridge University Press:  15 February 2011

M. R. Vanlandingham ,
S. H. Mcknight ,
G. R. Palmese ,
R. F. Eduljee ,
J. W. Gillespie JR.  and
R. L. Mccullough
M. R. Vanlandingham
Affiliation:
Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE 19716–3144
S. H. Mcknight
Affiliation:
Army Research Laboratory, Weapons and Materials Research Directorate, Aberdeen Proving Ground, MD 21005–5069
G. R. Palmese
Affiliation:
Center for Composite Materials, University of Delaware, Newark, DE 19716–3144
R. F. Eduljee
Affiliation:
Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE 19716–3144
J. W. Gillespie JR.
Affiliation:
Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE 19716–3144
R. L. Mccullough
Affiliation:
Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE 19716–3144
Get access

Abstract

The atomic force microscope (AFM) has become a popular tool for characterizing surfaces of many different types of materials. In this paper, an AFM is used to probe the mechanical properties of polymer samples through examination of force curves produced during tip-sample contact and indentation. Three types of cantilever probes with spring constants estimated to be 1–5 N/m, 20–100 N/m, and 400–500 N/m respectively, were used to study different polymer samples with known modulus values ranging from 20 MPa to 3 GPa. A technique is developed that relates the measured sample response to elastic modulus, and illuminates the importance of the relative stiffnesses of the cantilever probe and the sample to the material response.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 440: Symposia CA – Structure and Evolution of Surfaces , 1996 , 195
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Palmese, G. R. and McCullough, R. L., J. Adhesion, 44, 29 (1994).Google Scholar
2. Skourlis, T. P. and L.McCullough, R., Comp. Sci. Technol., 49, 363 (1993).Google Scholar
3. Madhukar, M. S. and Drzal, L. T., J. Comp. Mater., 25, 958 (1991).Google Scholar
4. Williams, J. G., Donnellan, M. E., James, M. R., and Morris, W. L., Mater. Sci. Eng., A126, 305 (1990).Google Scholar
5. Maivald, P., Butt, H. J., Gould, S. A. C., Prater, C. B., Drake, B., Gurley, I. A., Elings, V. B., and Hansma, P. K., Nanotechnol., 2, 103 (1991).Google Scholar
6. Magonov, S., Elings, V., and Whangbo, M.-H., Surface Sci., to be published (1996).Google Scholar
7. Burnham, N. A., Colton, R. J., and Pollock, H. M., J. Vac. Sci. Technol. A, 9, 2548 (1991).Google Scholar
8. Hues, S. M., Colton, R. J., Meyer, E., and Guntherodt, H.-J., MRS Bulletin, 18, 41 (1993).Google Scholar
9. Oliver, W. C. and Pharr, G. M., J. Mater. Res., 7, 1564 (1992).Google Scholar
10. Jarvis, S. P., Weihs, T. P., Oral, A., and Pethica, J. B. in Thin Films: Stresses and Mechanical Properties IV, edited by Townsend, P. H. (Mater. Res. Soc. Proc. 308, Pittsburgh, PA, 1993) pp. 127–132.Google Scholar
11. Pethica, J. B. and Oliver, W. C., Physica Scripta, T 19, 61 (1987).Google Scholar
12. King, R. B., Int. J. Solids Struct., 23, 1657 (1987).Google Scholar
13. VanLandingham, M. R., McKnight, S. H., Palmese, G. R., Elings, J. R., Huang, X., Bogetti, T. A., Eduljee, R. F., and Gillespie, J. W. Jr., Adhesion, J., submitted (1996).Google Scholar
14. Weisenhorn, A. L., Khorsandi, M., Kansas, S., Gotzos, V., and Butt, H.-J., Nanotechnol., 4, 106 (1993).Google Scholar
15. Elings, J. R., Support Note No. 225, Digital Instruments, 1996.Google Scholar
16. Sneddon, I. N., Int. J. Eng. Sci., 3, 47 (1965).Google Scholar
17. Bolshakov, A., Oliver, W. C., and Pharr, G. M. in Thin Films: Stresses and Mechanical Properties V, edited by Baker, S. P. (Mater. Res. Soc. Proc. 356, Pittsburgh, PA, 1995) pp. 675–680.Google Scholar
18. VanLandingham, M. R., McKnight, S. H., Palmese, G. R., Eduljee, R. F., Gillespie, J. W. Jr., and McCullough, R. L., J. Mater. Sci. Lett., to be published (1996); Proc. 11 th Techn. Conf. Amer. Soc. Comp., 635 (1996).Google Scholar