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Recording IR spectra for individual electrospun fibers using an in situ AFM-synchrotron technique

Published online by Cambridge University Press:  24 January 2012

Urszula Stachewicz
Affiliation:
Nanoforce Technology Ltd., Queen Mary, University of London, Joseph Priestley Building, Mile End Road, London, E1 4NS, U. K.
Fei Hang
Affiliation:
School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
Russell J. Bailey
Affiliation:
School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
Himadri S. Gupta
Affiliation:
School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
Mark D. Frogley
Affiliation:
Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus, Didcot, OX11 0DE, U.K.
Gianfelice Cinque
Affiliation:
Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus, Didcot, OX11 0DE, U.K.
Asa H. Barber
Affiliation:
Nanoforce Technology Ltd., Queen Mary, University of London, Joseph Priestley Building, Mile End Road, London, E1 4NS, U. K. School of Engineering and Material Science, Queen Mary, University of London, Mile End Road, London, E1 4NS, U. K.
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Abstract

A setup is described where an individual electrospun polyamide fiber is attached to an atomic force microscope (AFM) tip and structural information collected with synchrotron micro Fourier transform infrared spectroscopy (μFT-IR). The combination of AFM and synchrotron μFT-IR therefore highlights the potential for recording structure-mechanical property relationships simultaneously in materials with sub-micron dimensions.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

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