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Reconstructions at Si- and C-Terminated Surfaces of 2H-SiC: an ab Initio Molecular Dynamics Study

Published online by Cambridge University Press:  22 February 2011

Yong Gyoo Hwang
Affiliation:
On leave from Wonkwang University, Iri, Jeonbuk 570-749, Korea
Bin Chen
Affiliation:
Department of Physics, North Carolina State University, Raleigh, NC 27695-8202
Piotr Boguslawski
Affiliation:
Department of Physics, North Carolina State University, Raleigh, NC 27695-8202
J. Bernholc
Affiliation:
Department of Physics, North Carolina State University, Raleigh, NC 27695-8202
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Abstract

The reconstruction patterns of Si- and C-terminated surfaces of wurtzite SiC are studied by ab initio molecular dynamics. The (1×1) relaxed, (1×2) buckled, and (2×1) л-bonded chain geometries are considered. In the (l×1) geometry, inward relaxation of the C-terminated surface is much stronger than that of the Si-terminated surface. The C-terminated surface is stable with respect to (2×1) buckled reconstruction, but the Si-terminated surface is not. At both surfaces, the (2×1) л-bonded chain geometry is energetically the most favorable. The Si-C л-bonded chains are buckled and slightly dimerized. In both cases, the outermost atoms are carbons, due to the bond length constraints of the л-bonded chain reconstruction.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

1. Davis, R. F., Kelner, G., Shur, M., Palmour, J. W., and Edmond, J. A., Proc. IEEE, 79, 677 (1991).Google Scholar
2. Kaplan, R., Surf. Sci. 215, 111 (1989).Google Scholar
3. Kaplan, R. and Bermudez, V. M., to appear in “Properties of Silicon Carbide”, INSPEC Datareview Series, Vol. 7, edited by Harris, G. L., and references therin.Google Scholar
4. Pandey, K. C., Phys. Rev. Lett. 47, 1913 (1981).Google Scholar
5. Ancilotto, F., W.Andreoni, Selloni, A., Car, R., and Parrinello, M., Phys. Rev. Lett. 65, 3148 (1990).Google Scholar
6. Iarlori, S., Galli, G., Gygi, F., Parrinello, M., and Tossati, E., Phys. Rev. Lett. 69, 2947 (1992).Google Scholar
7. Vanderbilt, D. and Louie, S. G., Phys. Rev. B 30, 6118 (1984).Google Scholar
8. Car, R. and Parrinello, M., Phys. Rev. Lett. 55, 2471 (1985).Google Scholar
9. Ceperley, C. D. and Alder, B. J., Phys. Rev. Lett. 45, 566 (1980).Google Scholar
10. Perdew, J. P. and Zunger, A., Phys. Rev. B 23, 5048 (1981).Google Scholar
11. Hamann, D. R., Phys. Rev. B 40,2980 (1989).Google Scholar
12. Bachelet, G. B., Hamann, D. R., and Schlifter, M., Phys. Rev. B 26, 4199 (1982).Google Scholar
13. Wang, C., Zhang, Q.-M., and Bernholc, J., Phys. Rev. Lett. 69, 3789 (1992).Google Scholar