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Rapid Thermal Processing for Strained-Layer Semiconductor Devices

Published online by Cambridge University Press:  22 February 2011

John C. Zolper
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-5800
David R. Myers
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-5800
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Abstract

Strained-layer semiconductors have revolutionized modern heterostructure devices by exploiting the modification of semiconductor band structure associated with the coherent strain of lattice-mismatched heteroepitaxy. The modified band structure improves transport of holes in heterostructures and enhances the operation of semiconductor lasers. Strainedlayer epitaxy also can create materials whose band gaps match wavelengths (e. g. 1.06 μm and 1.32 μm) not attainable in ternary epitaxial systems lattice matched to binary substrates. Other benefits arise from metallurgical effects of modulated strain fields on dislocations.

Lattice mismatched epitaxial layers that exceed the limits of equilibrium thermodynamics will degrade under sufficient thermal processing by converting the as-grown coherent epitaxy into a network of strain-relieving dislocations. After presenting the effects of strain on band structure, we describe the stability criterion for rapid-thermal processing of strained-layer structures and the effects of exceeding the thermodynamic limits. Finally, device results are reviewed for structures that benefit from high temperature processing of strained-layer superlattices.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Osbourn, G. S., J. Appl. Phys. 53 (3) 1586 (1982).Google Scholar
2. Osbourn, G. S., Gourley, P. L., Fritz, I. J., Biefield, R. M., Dawson, L. R., and Zipperian, T. E., in Semiconductors & Semimetals. vol 24, edited by Dingle, R., (Academic Press, New York, 1987) chapter 8.Google Scholar
3. Arent, D. J., Deneffe, K., Hoof, C. Van, Boeck, J. De, and Borghs, G., J. Appl. Phys. 66 (4) 1739 (1989).Google Scholar
4. Fritz, I. J., Brennan, T. M., and Ginley, D. S., Solid State Comm., 75, 289 (1990).Google Scholar
5. Myers, D. R., OSA Proc. Picosecond Electronics and Optoelectronics, vol 9, edited by Sollner, G. and Shah, J., 236 (1991).Google Scholar
6 Zipperian, T. E., Dawson, L. R., Barnes, C. E., Wiczer, J. J., and Osbourn, G. C., Tech. Digest IEDM, p. 524 (1984).Google Scholar
7. Fritz, I. J. and Schirber, J. E., in Compound Semiconductor Strained-Layer Superlattices. edited by Biefield, R. M. (Trans Tech Publications, Switzerland, 1989) p. 83.Google Scholar
8. Welch, D. F., Streifer, W., Schaus, C. F., Sun, S., and Gourley, P. L., Appl. Phys. Lett. 56 (1) 10(1990).Google Scholar
9. Dodson, B. W. and Fritz, I. J., in Compound Semiconductor Strained-Layer Superlattices. edited by Biefield, R. M. (Trans Tech Publications, Switzerland, 1989) p. 29.Google Scholar
10. Matthews, J. W. and Blakeslee, A. E., J. Crystal Growth, 27, 118 (1983).Google Scholar
11. Vawter, G. A. and Myers, D. R., J. Appl. Phys. 65 (12), 4770 (1989).Google Scholar
12. Tsao, I. Y. and Dodson, B. W., Appl. Phys. Lett. 53 (10), 848 (1988).Google Scholar
13. Peercy, P. S., Dodson, B. W., Tsao, J. Y., Jones, E. D., Myers, D. R., Zipperian, T. E., Dawson, L. R., Biefield, R. M., Klein, J. F., Hills, C. R., IEEE Electron Device Lett., EDL–9 (12), 621 (1988).Google Scholar
14. Picraux, S. T., Arnold, G. W., Myers, D. R., Dawson, L. R., Biefield, R. M., Fritz, I. J., and Zipperian, T. E., Nucl. Inst. and Methods in Phys. Res. B7/8, 453 (1985).Google Scholar
15. Myers, D. R., in Compound Semiconductor Strained-Layer Superlattices. edited by Biefield, R. M. (Trans Tech Publications, Switzerland, 1989) p. 165.Google Scholar
16. Drummond, T. J., Zipperian, T. E., Fritz, I. J., Schirber, J. E., and Plut, T. A., Appl. Phys. Lett. 49 (8), 461 (1986).Google Scholar
17. Daniels, R. R., Ruden, P. P., Shur, M., Grider, D., Nohava, T. E., and Arch, D. K., IEEE Electron Device Letts. EDL–9 (7), 355 (1988).Google Scholar
18. Kolbas, R. M., Anderson, N. G., Laidig, W. D., Sin, Y., Lo, Y. C., Hsieh, K. Y., and Yang, Y. J., J. Quan. Elec. 24 (8), 1605 (1988).Google Scholar
19. Vawter, G. A., Myers, D. R., Brennan, T. M., and Hammons, B. E., Appl. Phys. Lett. 56 (20), 1945 (1990).Google Scholar
20. Zipperian, T. E., Jones, E. D., Dodson, B. W., Klem, J. F., and Gourley, P. L., Proceedings of 10th GaAs IC Symposium, 251 (1988).Google Scholar