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Raman Studies of Stress-Induced Phase Transformations in Titania Films

Published online by Cambridge University Press:  15 February 2011

Gregory J. Exarhos  and
Nancy J. Hess
Gregory J. Exarhos
Affiliation:
Pacific Northwest Laboratory, PO BOX 999 MS K2-44, Richland WA 99352
Nancy J. Hess
Affiliation:
Pacific Northwest Laboratory, PO BOX 999 MS K2-44, Richland WA 99352
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Abstract

Time-resolved micro-Raman spectroscopy is used to follow the amorphous to crystalline phase transformation in sol-gel deposited titania films induced thermally or through the action of applied hydrostatic pressure in a diamond anvil cell. Time-dependent phonon intensities intrinsic to the growing phase are related to the volume fraction of crystallite present at any time. The sigmoidally generated curves can be modeled in terms of modified Avrami ingrowth kinetics in which diffusion of the amorphous phase to the nucleation center is restricted by the morphology of the evolving phase. Phonon frequency and linewidth measurements during the course of the transformation probe changes in film stress and particle size which are used to understand the mechanistics of the transformation. Raman measurements also are used to derive a phase stability diagram for titania films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 230: Symposium R – Phase Transformation Kinetics in Thin Films , 1991 , 327
Copyright
Copyright © Materials Research Society 1992

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References

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