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Raman Scattering Investigation of Superconductivity in Si46 Clathrates

Published online by Cambridge University Press:  15 February 2011

S. L. Fang ,
L. Grigorian ,
A. M. Rao ,
P. C. Eklund ,
G. Dresselhaus ,
M. S. Dresselhaus ,
H. Kawaji  and
S. Yamanaka
S. L. Fang
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506, USA
L. Grigorian
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506, USA
A. M. Rao
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506, USA
P. C. Eklund
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY 40506, USA
G. Dresselhaus
Affiliation:
Massachusetts Institute of Technology, Cambridge, MA 02139, USA
M. S. Dresselhaus
Affiliation:
Massachusetts Institute of Technology, Cambridge, MA 02139, USA
H. Kawaji
Affiliation:
Department of Applied Chemistry, Faculty of Engineering, Hiroshima University, Higashi-Hiroshima 724, Japan
S. Yamanaka
Affiliation:
Department of Applied Chemistry, Faculty of Engineering, Hiroshima University, Higashi-Hiroshima 724, Japan
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Abstract

Room temperature Raman scattering spectra are reported for the type II superconductors MxBaySi46 (M-Na, K) which were recently shown to exhibit Tc's ∼ 3.5 K. The spectra are compared to those of other Si46-clathrates which exhibit normal metallic behavior down to 2K. Thirteen of the twenty first-order Raman frequencies predicted by group theory have been detected, and the frequencies are found to be sensitive to the particular dopants. The Raman linewidths observed for the MxBaySi46 system are comparable to those observed for Na8Si46 and K7Si46. The data, taken collectively, suggest that the line broadening in the metallic Si-clathrates is due to important contributions from both the electron-phonon interaction as well as to a random filling of the Si cages.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 452 , 1996 , 231
Copyright
Copyright © Materials Research Society 1997

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References

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