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Quantitative HRTEM investigation of an obtuse angle dislocation reaction in gold with a CS corrected field emission microscope

Published online by Cambridge University Press:  01 February 2011

Joerg R. Jinschek ,
Ch. Kisielowski ,
T. Radetic ,
U. Dahmen ,
M. Lentzen ,
A. Thust  and
K. Urban
Joerg R. Jinschek
Affiliation:
National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory (LBNL), One Cyclotron Road, MS 72/125, Berkeley, CA, 94720, U.S.A.
Ch. Kisielowski
Affiliation:
National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory (LBNL), One Cyclotron Road, MS 72/125, Berkeley, CA, 94720, U.S.A. Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
T. Radetic
Affiliation:
National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory (LBNL), One Cyclotron Road, MS 72/125, Berkeley, CA, 94720, U.S.A.
U. Dahmen
Affiliation:
National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory (LBNL), One Cyclotron Road, MS 72/125, Berkeley, CA, 94720, U.S.A.
M. Lentzen
Affiliation:
Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
A. Thust
Affiliation:
Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
K. Urban
Affiliation:
Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
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Abstract

We investigate quantitatively the non periodic arrangement of atom columns surrounding an obtuse angle dislocation reaction in gold utilizing a CM200 FEG instrument equipped with a spherical aberration corrector. The in-plane component of the Burgers vector of the observed stair-rod dislocation is ⅙ [110]. Column positions are determined from single lattice images and compared with those from a reconstructed electron exit wave. We find that absolute position measurements of 1–3 pm require knowledge of the defocus to better than 1 nm which can be achieved by a reconstruction of the exit-plane wave. In contrast, a defocus value of 8.9 nm already leads to apparent displacements as large as 35 pm if single lattice images are considered. Such discrepancies are either caused by residual lens aberrations or by the superposition of delocalization effects at interfaces caused by defocusing of the objective lens. Commonly, however, only relative displacements are of interest. In this case the CS corrector improves the interpretability of single defocused lattice images with a remarkable signal to noise ratio which is advantageous for in-situ experiments. As an example for analyzing in-situ experiments we determine displacements recorded in a time resolved experiment of radiation induced atom motion on surfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 727: Symposium R – Nanostructured Interfaces , 2002 , R1.3
Copyright
Copyright © Materials Research Society 2002

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