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Quantitative Determination of Er in Silica-Based Matrices

Published online by Cambridge University Press:  15 February 2011

Daniel W. Oblas ,
Francis Pink ,
Mahendra P. Singh ,
Joseph Connolly ,
Donald Dugger  and
T. Michael Wei
Daniel W. Oblas
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Rd., Waltham, MA 02254
Francis Pink
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Rd., Waltham, MA 02254
Mahendra P. Singh
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Rd., Waltham, MA 02254
Joseph Connolly
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Rd., Waltham, MA 02254
Donald Dugger
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Rd., Waltham, MA 02254
T. Michael Wei
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Rd., Waltham, MA 02254
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Abstract

The distribution and concentration of dopants in the core of an optical fiber, at low concentrations, particularly the rare earth dopants, are difficult to measure quantitatively. However, such information is critical to the determination of absorption cross sections of rare earth dopants in fiber amplifiers and the optimization of their performance. A number of different analytical techniques, such as secondary ion mass spectrometry (SIMS) and the electron probe microanalyzer (EPMA) were used here, along with prepared glass standards, to determine the Er concentration and distribution in optical fiber preforms containing Al, Ge and P. These results were compared with data obtained by neutron activation analysis (NAA) and x-ray fluorescence (XRF) which measure the average concentration of Er in the core. It has been shown that SIMS (and EPMA), in conjunction with NAA data can be used to establish, quantitatively, the Er concentration in the preform core, without the need for glass standards.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 244: Symposium J – Optical Waveguide Materials , 1991 , 149
Copyright
Copyright © Materials Research Society 1992

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References

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