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Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy

Published online by Cambridge University Press:  10 February 2011

W. Arnold ,
S. Amelio ,
S. Hirsekorn  and
U. Rabe
W. Arnold
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
S. Amelio
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
S. Hirsekorn
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
U. Rabe
Affiliation:
Fraunhofer-Institute for Nondestructive Testing (IZFP), Bldg. 37, University, D-66123 Saarbrficken, Germany (arnold@izfp.fhg.de)
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Abstract

Atomic Force Acoustic Microscopy is a near-field technique which combines the ability in using ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively with a resolution of approximately 20 rum exploiting the contact resonance frequencies of standard cantilevers used in Atomic Force Microscopy. The Young's modulus of nanocrystalline ferrite films have been measured as a function of oxidation temperature. Furthermore images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999 , 183
Copyright
Copyright © Materials Research Society 2000

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References

Reerences

[1]Maivald, P., Butt, H.T., Gould, S.A., Prater, C.B., Drake, B., Gurley, J.A., Elings, V.B., and Hansma, P.K., Nanotech. 2,103 (1991).Google Scholar
[2]Radmacher, M., &Tillmann, W., and Gaub, H.E., Biophys. J. 64 735 (1993).Google Scholar
[3]Rohrbeck, W. and Chilla, E., Phys.Stat.Sol(a) 131, 69 (1992).Google Scholar
[4]Yamanaka, K., Ogiso, H., and Kolosov, O., Appl. Phys. Lett. 64, 178 (1994).Google Scholar
[5]Rabe, U. and Arnold, W., Appl. Phys. Lett. 64, 1493 (1994)Google Scholar
[6]Cretin, B. and Sthal, F., Appl. Phys. Lett. 62, 829 (1993).Google Scholar
[7]Burnham, N. A., Gremaud, G., Kulik, A.J., Gallo, P.-J., and Oulevy, F., J. Vac. Sci. Tech. B14, 1308 (1996).Google Scholar
[8]Rosa, A., Weilandt, E., Hild, S., and Marti, O., Meas. Sci. Tech. 8, 1 (1997).Google Scholar
[9]Rabe, U., Janser, K., and Arnold, W., Rev. Sci. Instrum. 67, 3281 (1996).Google Scholar
[10]Scherer, V., Arnold, W., and Bhushan, B., Surf. Interface Analysis, 27, 578 (1999)Google Scholar
[11]Hirsekorn, S., Appl. Phys. A66, S249 (1998).Google Scholar
[12]Rabe, U., Janser, K., and Arnold, W., in Acoustical Imaging, edited by Tortoli, P. and Masotti, L., Plenum Press, New York, 22, 669 (1996).Google Scholar
[13]Kolosov, O., Briggs, A., Yamanaka, K., and Arnold, W., in Acoustical Imaging, edited by Tortoli, P. and Masotti, L., Plenum Press, New York, 22, 665 (1996).Google Scholar
[14]Stark, R. W., Drobek, T., and Heckl, W. M., Appl. Phys. Lett. 74, 3296 (1999)Google Scholar
[15]Koch, A.J. and Becker, J.J, J. Appl. Phys. 39, 1261 (1968).Google Scholar
[16]Kester, E., Gillot, B, and Tailhades, Ph., Mat. Chem. Physics 51, 258 (1997).Google Scholar
[17]Kester, E. and Gillot, B., J. Phys. Chem. Solids, 59, 1259 (1998),Google Scholar
[18]Wright, O. and Nishiguchi, N., Appl. Phys. Lett. 71, 626 (1997)Google Scholar
[19]Yamanaka, K., Noguchi, A., Tsuji, T., Koike, T., and Goto, T., Surf. Interf. Analys., 27, 600 (1999)Google Scholar
[20]Hirsekorn, S., Rabe, U., and Arnold, W., Nanotechnology 8, 57 (1997).Google Scholar
[21]Turner, J., Hirsekorn, S., Rabe, U., and Arnold, W., J. Appl. Phys. 82, 966 (1997).Google Scholar
[22]Rabe, U., Turner, J., and Arnold, W., Appl. Phys., A66, S277 (1998).Google Scholar
[23]Rabe, U., Kester, E., and Arnold, W., Surf. Interface Anal. 27, 386 (1999).Google Scholar
[24]Mazeran, P.E. and Loubet, J.L., Trib. Lett. 3, 125 (1997).Google Scholar
[25]Johnson, K., Contact Mechanics, Cambridge University Press (1995).Google Scholar
[26]Rabe, U., Amelio, S., Hirsekorn, S., and Arnold, W., Ultrasonics, (2000), to be publishedGoogle Scholar
[27]Kester, E., Rabe, U., Presmanes, L., Tailhades, Ph., and Arnold, W., J. Phys. Chem. Sol., (2000), to be publishedGoogle Scholar
[28]Langlet, M. and Joubert, J. C., J. Appl. Phys. 64, 780 (1988).Google Scholar
[29]Nayfeh, A.H. and Mook, D.T., Nonlinear Oscillations, John Wiley, New York, 1995.Google Scholar
[30]Nayak, P.R., J. Sound and Vibration 22, 297 (1972).Google Scholar
[31]Auciello, O., Gruverman, A., Tokumoto, H., Prakash, S.A., Aggarwal, S., and Ramesh, R., MRS Bulletin, Jan. 1998, p.33.Google Scholar
[32]Rabe, U., Kester, E., Scherer, V., and Arnold, W., in Acoustical Imaging, edited by Lee, H., 24, (1999), Plenum Press, New York, to be publishedGoogle Scholar
[33]Eng, L. M., Güntherodt, H.-J., Schneider, G. A., Köpke, U, and Saldana, J. Munoz, Appl. Phys. Lett. 74, 233. (1999)Google Scholar
[34] see for example Moulson, A., and Herbert, J. M., Electroceramics, Chapman and Hall, London, 1990Google Scholar