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Pulsed Laser Deposition of Superconductor/Ferromagnetic YBa2Cu3Oy/SrTiO3/La2/3Sr1/3MnO3 Heterostructures

Published online by Cambridge University Press:  10 February 2011

V. Trtík ,
F. Sánchez ,
C. Ferrater ,
M. Varela ,
L. Fábrega ,
R. Rubi  and
J. Fontcuberta
V. Trtík
Affiliation:
Departament de Física Aplicada i Òptica, Universitat de Barcelona, Diagonal 647, Barcelona, E-08028, SPAIN, vtrtik@fao.ub.es
F. Sánchez
Affiliation:
Departament de Física Aplicada i Òptica, Universitat de Barcelona, Diagonal 647, Barcelona, E-08028, SPAIN, vtrtik@fao.ub.es
C. Ferrater
Affiliation:
Departament de Física Aplicada i Òptica, Universitat de Barcelona, Diagonal 647, Barcelona, E-08028, SPAIN, vtrtik@fao.ub.es
M. Varela
Affiliation:
Departament de Física Aplicada i Òptica, Universitat de Barcelona, Diagonal 647, Barcelona, E-08028, SPAIN, vtrtik@fao.ub.es
L. Fábrega
Affiliation:
Institut de Ciència de Materials de Barcelona - CSIC. Bellaterra E-08193, SPAIN
R. Rubi
Affiliation:
Institut de Ciència de Materials de Barcelona - CSIC. Bellaterra E-08193, SPAIN
J. Fontcuberta
Affiliation:
Institut de Ciència de Materials de Barcelona - CSIC. Bellaterra E-08193, SPAIN
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Abstract

YBa2Cu3Oy/SrTiO3/La2/3Sr1/3MnO3 heterostructures have been deposited on LaAlO3(001) and SrTiO3(001) substrates by pulsed laser deposition. First, the influence of deposition conditions on crystallinity and morphology of single LSMO films was examined. Results were used for preparation of heterostructures in tri-layer and cross-strip geometry. Cross-strip geometry was defined by direct shadow mask patterning. Different characterization techniques have been used to determine and correlate the heterostructure properties. A complete analysis of the crystal structure has been carried out with a four-circle difractometer. Morphology has been studied by scanning electron microscopy and atomic force microscopy in order to determine surface roughness and droplet density. Basic electrical properties of films have been determined.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 574: Symposia BB – Multicomponent Oxide Films for Electronics , 1999 , 335
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

[1] Stroud, R.M., Kim, J., Eddy, C.R., Chrisey, D.B., Horwitz, J.S., Koller, D., Osofsky, M.S., Soulen, R.J., Jr., and Auyeung, R.C.Y., J. Appl. Phys. 83, p. 7189 (1998).10.1063/1.367676Google Scholar
[2] Koller, D., Osofsky, M.S., Chrisewy, D.B., Horwitz, J.S., Soulen, R.J., Jr., Stroud, R.M., Eddy, C.R., Kim, J., Auyeung, R.C.Y., Byers, J.M., Woodfield, B.F., Daly, G.M., Clinton, T.W., and Johnson, M., J. Appl. Phys. 83, p. 6774 (1998).10.1063/1.367763Google Scholar
[3] Dong, Z.W., Pai, S.P., Ramesh, R., Venkatesan, T., Johnson, M., Chen, Z.Y., Cavanaugh, A., Zhao, Y.G., Jiang, X.L., Sharma, R.P., Ogale, S., and Green, R.L., J. Appl. Phys. 83, p. 6780 (1998).10.1063/1.367764Google Scholar
[4] Lian, G.L., Wang, Z.H., Gao, J., Zhou, Y.Q., Kang, J.F., Li, M.Y., Xiong, G.C., Solid State Commun. 108, p. 123 (1998).10.1016/S0038-1098(98)00321-4Google Scholar