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Pulsed Electron Beam Melting of Fe*

Published online by Cambridge University Press:  15 February 2011

A. Knapp  and
D. M. Follstaedt
A. Knapp
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185†
D. M. Follstaedt
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185†
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Abstract

Pulsed (50 nsec) electron beams with deposited energies of 1.1 ­ 2.4 J/cm2 have been used to rapidly melt a surface layer of Fe. Calculations show that this range of energies produces melt depths from 0.4–1.2 μm and melt times of 100–500 nsec. Optical microscopy and SEM of pulse treated polycrystalline foils show slip traces, as well as a general smoothing of surface features which shows that melting has occurred. TEM shows that the resolidified material is bcc, and that the material within a grain is epitaxial with the substrate. TEM also shows slip traces of {110} planes, as well as a high density of dislocations, both extended and loop. At the highest energy, subgrain boundaries are observed. Some samples were implanted with 1×1016 Sn/cm2 at 150 keV. After pulse treatment, the Sn depth profile was observed to have broadened, consistent with liquid phase diffusion. The Sn had the unexpected effect of suppressing slip at the sample surface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 4: Symposium A – Laser and Electron-Beam Interactions with Solids , 1981 , 407
Copyright
Copyright © Materials Research Society 1982

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Footnotes

†

A. U. S. Department of Energy Facility.

*

This work supported by the U. S. Department of Energy, DOE, under contract number DE–AC04–76–DP00789.

References

REFERENCES

1. Picraux, S. T., Knapp, J. A. and Wampler, W. R., to be published.Google Scholar
2. Thermophysical Properties of Matter, Touloukian, Y. S., Powell, R. W., Ho, C. Y. and Klemens, P. G., the TPRC Data Series, Vol. 1 (IFI/Plenum, New York 1970).Google Scholar
3. McDonald, J. M., private communication.Google Scholar
4. Follstaedt, D. M., Picraux, S. T., Peercy, P. S. and Wampler, W. R., Appl. Phys. Lett. 39, 327 (1981).Google Scholar
5. Buene, L., Jacobson, D. C., Nakahara, S., Poate, J. M., Draper, C. W. and Hirvonen, J. K., in Laser and Electron-Beam Solid Interactions and Materials Processing, Gibbons, J. F., Hess, L. D. and Sigmon, T. W., eds. (North-Holland, New York 1981), p.583.Google Scholar
6. Follstaedt, D. M. and Wampler, W. R., Appl. Phys. Lett. 38, 140 (1981).CrossRefGoogle Scholar
7. Buene, L., Kaufmann, E. N., Preece, C. M. and Draper, C. W., in Ref. 5, p.591.Google Scholar
8. Treheux, D., Marchive, D., Delagrange, J. and Guiraldenq, P., Acad, C. R.. Sc. Paris 274, 1260 (1972).Google Scholar