Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Alpuim, P
Chu, V
and
Conde, J.P
2000.
Low substrate temperature deposition of amorphous and microcrystalline silicon films on plastic substrates by hot-wire chemical vapor deposition.
Journal of Non-Crystalline Solids,
Vol. 266-269,
Issue. ,
p.
110.
Alpuim, P.
Chu, V.
and
Conde, J. P.
2001.
Doping of amorphous and microcrystalline silicon films deposited at low substrate temperatures by hot-wire chemical vapor deposition.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 19,
Issue. 5,
p.
2328.
Fortunato, Elvira
Nunes, Patrícia
Marques, António
Costa, Daniel
Águas, Hugo
Ferreira, Isabel
Costa, Maria E. V.
and
Martins, Rodrigo
2001.
Thin Film Metal Oxide Semiconductors Deposited on Polymeric Substrates.
MRS Proceedings,
Vol. 666,
Issue. ,
Fortunato, E.
Nunes, P.
Marques, A.
Costa, D.
Águas, H.
Ferreira, I.
Costa, M.E.V.
Godinho, M.H.
Almeida, P.L.
Borges, J.P.
and
Martins, R.
2002.
Transparent, conductive ZnO:Al thin film deposited on polymer substrates by RF magnetron sputtering.
Surface and Coatings Technology,
Vol. 151-152,
Issue. ,
p.
247.
Gleskova, H.
Wagner, S.
Soboyejo, W.
and
Suo, Z.
2002.
Electrical response of amorphous silicon thin-film transistors under mechanical strain.
Journal of Applied Physics,
Vol. 92,
Issue. 10,
p.
6224.
Cheng, I-Chun
and
Wagner, Sigurd
2002.
Hole and electron field-effect mobilities in nanocrystalline silicon deposited at 150 °C.
Applied Physics Letters,
Vol. 80,
Issue. 3,
p.
440.
Jang, Jin
2003.
Thin-Film Transistors.
Alpuim, P.
Chu, V.
and
Conde, J. P.
2003.
Electronic and structural properties of doped amorphous and nanocrystalline silicon deposited at low substrate temperatures by radio-frequency plasma-enhanced chemical vapor deposition.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 21,
Issue. 4,
p.
1048.
Panda, Durga P.
and
Dalal, Vikram
2006.
Influence of Annealing on Crystallinity and Conductivity of p-type Nanocrystalline Si films.
MRS Proceedings,
Vol. 910,
Issue. ,