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Progress on Searching Optimal Thermal Spray Parameters for Magnesium Silicide

Published online by Cambridge University Press:  18 January 2013

Gaosheng Fu ,
Lei Zuo ,
Jon Longtin ,
Yikai Chen  and
Sanjay Sampath
Gaosheng Fu
Affiliation:
Department of Mechanical Engineering, and State University of New York at Stony Brook, Stony Brook, NY 11794, U.S.A.
Lei Zuo*
Affiliation:
Department of Mechanical Engineering, and State University of New York at Stony Brook, Stony Brook, NY 11794, U.S.A.
Jon Longtin
Affiliation:
Department of Mechanical Engineering, and State University of New York at Stony Brook, Stony Brook, NY 11794, U.S.A.
Yikai Chen
Affiliation:
Department of Material Science and Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794, U.S.A.
Sanjay Sampath
Affiliation:
Department of Material Science and Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794, U.S.A.
*
*(lzuo@notes.cc.sunysb.edu, 631-632-9327)
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Abstract

The thermoelectric properties of Mg2Si coatings prepared by Atmospheric Plasma Spray (APS), and Vacuum Plasma Spray (VPS) are presented. Seebeck coefficient results of both APS and VPS have been reported. XRD and SEM analysis of the samples are also presented to understand how microstructure influences the coating thermoelectric properties. The results suggest significant improvements can be made on the reduction of impurity including oxidation and pure silicon by using proper spray method and parameters. Thermal spray has been demonstrated before to be effective way to reduce thermal conductivity which may due to the coating microstructure. VPS result shows higher Seebeck coefficient than APS which may due to lower level of oxidization.

Keywords

thermoelectricx-ray diffraction (XRD)scanning electron microscopy (SEM)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1490: Symposium B – Thermoelectric Materials Research and Device Development for Power Conversion and Refrigeration , 2013 , pp. 173 - 177
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Morris, R.G., Redin, R.D., and Danielson, G.C., Phys. Rev.,109, (1958)Google Scholar
LaBotz, R.J., Mason, D.R., and O'Kane, D.F., J. Elec. Soc.,110, 127–134. (1963)CrossRefGoogle Scholar
Zaitsev, V.K., Phys. Rev. B, 74(4), 045207. (2006)CrossRefGoogle Scholar
Riffel, M. and Schilz, J.., 15th Intl. Conf. (1996)Google Scholar
Jung, J.-Y. and Kim, I.-H., Elec. Mat. Lett., 6(4), 187–191(2010)CrossRefGoogle Scholar
Kajikawa, , Proc ICT '97. XVI Intl. Conf. (1997)Google Scholar
Kajikawa, , Proc ICT 98. XVII Intl. Conf. (1998)Google Scholar
Tani, J.-I. and Kido, H., Phys. B: Cond. Mat.,364(1–4),218-224, (2005)CrossRefGoogle Scholar
Akasaka, M., et al. ., J. Cry. Grow.,304(1), 196–201, (2007)CrossRefGoogle Scholar
Tamura, D., et al. ., Thin Solid Films, 515(22, 8272–8276, (2007)CrossRefGoogle Scholar
Li, Q., Lin, Z.W., and Zhou, J., J. Elec. Mat., 38(7), 1268–1272, (2009)CrossRefGoogle Scholar
Sampath, S., JTST, 19(5), 921–949, (2010)CrossRefGoogle Scholar
Zhou, J., Jie, Q., Wu, L.J., Dimitrov, I., Li, Q., and Shi, X., J. Mater. Res., 26(15), (2011)Google Scholar
Longtin, J., Zuo, L., et al. . JTST (unpublished) Google Scholar
Zhang, B., Zuo, L., Fu, G., et al. . Proceeding of Heat Trans. Conf. (2012).Google Scholar
Schilz, J., et al. . J. Mat. Sci. Letter.,17(17), 1487–1490, (1998)CrossRefGoogle Scholar
Ueno, K., et al. . Proc. ICT 98. XVII Intl. Conf. (1998)Google Scholar
Takahashi, Y., et al. . 18th Intl. Conf. (1999)Google Scholar
Cherigui, M., Fenineche, N.E., and Coddet, C., Surf. Coat. Tech.,192(1), 19–26, (2005)CrossRefGoogle Scholar