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Processing and Characterization of HgBrxI2−x Radiation Detectors

Published online by Cambridge University Press:  21 February 2011

C. Zhou ,
M. R. Squillante ,
L. P. Moy  and
P. Bennett
C. Zhou
Affiliation:
Radiation Monitoring Devices, Inc., 44 Hunt St., Watertown, MA 02172
M. R. Squillante
Affiliation:
Radiation Monitoring Devices, Inc., 44 Hunt St., Watertown, MA 02172
L. P. Moy
Affiliation:
Radiation Monitoring Devices, Inc., 44 Hunt St., Watertown, MA 02172
P. Bennett
Affiliation:
Radiation Monitoring Devices, Inc., 44 Hunt St., Watertown, MA 02172
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Abstract

This paper reports our recent work on the crystal processing, structural and optical characterization of HgBrxI2−x nuclear radiation detectors. To understand the electrical and optical properties of the detectors, we measured the energy gap of HgBrxI2−x as a function of the Br/I ratio. The energy band of this ternary semiconductor compound can be modulated from 2. 1eV (HgI2) to 3.4eV (HgBr2) by adjusting its chemical composition. This energy scope covers a wavelength spectrum between 365nm and 596nm, much of the visible spectrum. Nuclear and photoconductive detectors were fabricated from HgBrxI2−x single crystals and the responses of these devices were investigated with different radiation sources (241Am, 137Cs).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 357
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Turyanista, U. D. and Khiminets, V. V., Soy. Phys. Crystallography, 18, 688 (1974).Google Scholar
2. Lammonds, H. A., Nucl. Inst. & Meth. A213, 5 (1983).Google Scholar
3. Mayer, J. W., J. Appl. Phys. 38, 296 (1967)Google Scholar
4. Mayer, J. W., in: Semiconductor Detectors, eds., Bertolini, G. and Coche, A., (Wiley Interscience, NY, NY, 1968) p451, p475.Google Scholar
5. Knoll, G. F., Radiation Detection and Measurement, Second Edition, (John Wiley and Sons, NY, NY, 1989) p231.Google Scholar
6. Shah, K. S., Moy, L. P., Zhang, J., Olschner, F., Lund, J. C., Squillante, M. R., Nuc. Inst. & Methods in Phys. Res., A322, 509, (1992)CrossRefGoogle Scholar