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Piezoresponse Force Microscopy Characterization of PTO Thin Films

Published online by Cambridge University Press:  31 January 2011

Alessio Morelli ,
Sriram Venkatesan ,
George Palasantzas ,
Bart J. Kooi  and
Jeff De Hosson
Alessio Morelli
Affiliation:
amorelli@mpi-halle.mpg.de, Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
Sriram Venkatesan
Affiliation:
s.venkatesan@rug.nl, Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
George Palasantzas
Affiliation:
g.palasantzas@rug.nl, Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
Bart J. Kooi
Affiliation:
b.j.kooi@rug.nl, Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
Jeff De Hosson
Affiliation:
j.t.m.de.hosson@rug.nl, Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
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Abstract

The piezoelectric properties of PTO thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

Keywords

piezoresponsedefectsferroelectric
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1186: Symposium JJ – Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems , 2009 , 1186-JJ04-03
Copyright
Copyright © Materials Research Society 2009

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