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Penetration Depth Measurements of YBa2Cu3O7-δ at 4 MHz

Published online by Cambridge University Press:  28 February 2011

H. Wiesmann
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
R. R. Corderman
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
A. R. Moodenbaugh
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
M. W. Ruckman
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
Myron Strongin
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
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Abstract

Measurements were made of the penetration depth of bulk and powder samples of YBa2Cu3O7-δ. The samples were placed in an inductor which was part of the resonant circuit of a 4 MHz tunnel diode oscillator. The oscillator was stable to at least 1 part in 106 at 77 K. Changes in the sample susceptibility were easily detected by changes in the oscillator frequency. Analysis of the smallest powders fabricated gave a value of the measured penetration depth λmea = 0.23 μm. The measurement methodology is quantitative and the value of Xmea is believed to be an upper bound of the true penetration depth.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

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