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The Origin of Resonance Phenomena in Reflection High-Energy Electron Diffraction

Published online by Cambridge University Press:  15 February 2011

S. L. Dudarev  and
M. J. Whelan
S. L. Dudarev
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, U.K.
M. J. Whelan
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, U.K.
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Abstract

Resonance scattering of high-energy electrons is responsible for the appearance of bright features observed in reflection high-energy electron diffraction (RHEED) patterns and has found numerous applications in reflection electron microscopy and in RHEED studies of dynamics of molecular beam epitaxial growth of semiconductor crystals. In this paper we report on recent developments in theoretical understanding of the processes leading to resonance reflection of high-energy electrons from a crystal surface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 404: Symposium J – In Situ Electron and Tunneling Microscopy of Dynamic Processes , 1995 , 149
Copyright
Copyright © Materials Research Society 1996

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