Hostname: page-component-7479d7b7d-pfhbr Total loading time: 0 Render date: 2024-07-12T23:04:23.580Z Has data issue: false hasContentIssue false
  • English
  • Français

Oriented Microstructure of Ybco Thick Films

Published online by Cambridge University Press:  28 February 2011

F. Wellhofer ,
T.C. Shields ,
J.S. Abell  and
K.N.R. Taylor
F. Wellhofer
Affiliation:
Permanent address: Lucas Advanced Engineering Centre, Shirley, Solihull B90 4JJ, UK
T.C. Shields
Affiliation:
Superconductivity Research GroupSchool of Metallurgy and Materials, University of Birmingham, Birmingham B15 2TT, UK
J.S. Abell
Affiliation:
Superconductivity Research GroupSchool of Metallurgy and Materials, University of Birmingham, Birmingham B15 2TT, UK
K.N.R. Taylor
Affiliation:
Superconductivity Research GroupSchool of Metallurgy and Materials, University of Birmingham, Birmingham B15 2TT, UK
Get access

Abstract

The surface morphology and internal structure of a superconducting screen printed thick film of YBCO has been examined by means of optical and scanning electron microscopy. The highly textured track was sintered at a temperature above the peritectic temperature of the 123 phase, and the resulting characteristic spherulitic morphology has been found to be associated with underlying elongated strands of CuO. The composition of the inter‐diffusion layer formed at the film/substrate boundary is consistent with a Ba(Zr,Cu)O3 solid solution with small concentrations of yttrium.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 813
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Koinuma, H., Hashimoto, T., Nakamura, T., Kishio, K., Kitazawa, K. and Fueki, K., Jap. J. Appl. Phys. 26, L761 (1987).Google Scholar
2 Tabuchi, J. and Utsumi, K., Appl. Phys. Lett., 53, 606 (1988).Google Scholar
3 Yoshiara, K., Kagata, K., Ybkoyama, S., Hiroki, T., Higuma, H., Yamazaki, T. and Nakahigashi, K., Jap. J. Appl. Phys. 27 L1492 (1988)Google Scholar
4 Abell, J.S., Shields, T.C., Wellhofer, F., Holland, D., Blunt, L., Yakinci, M.E. and Taylor, K.N.R., Proc. Eur. Cer. Res. Soc., in press.Google Scholar
5 Shields, T.C., Wellhofer, F., Abell, J.S., Taylor, K.N.R. and Holland, D., M2S‐HTC, Stanford, Physica C, in press.Google Scholar
6 Abell, J.S., Wellhofer, F., Taylor, K.N.R., Shields, T.C., Holland, D., Blunt, L. and Yakinci, M.E., Proc. Int. Conf. Supercon, Paris, in pressGoogle Scholar
7 Licci, F., Tissot, P. and Scheel, H.J., J. Less‐Common Metals 150 (1989) 201‐206 Google Scholar
8 Scheel, H.J., Sadowski, W. and Schellenberg, L., J. Supercon. Sci. Tech. 2, 17 (1989)Google Scholar
9 Miller, J.H., Holder, S.L. and Hunn, J.D., Appl. Phys. Lett.,54, 2256 (1989).Google Scholar