Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-06-17T12:56:24.568Z Has data issue: false hasContentIssue false

Ordered Structures of Zn1-xFexSe Epilayers Grown on GaAs Substrates with ZnSe Buffer Layers

Published online by Cambridge University Press:  22 February 2011

H.-Y. Wei
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742-2115
D. Prasad Beesabathina
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742-2115
L. Salamanca-Riba
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742-2115
B. T. Jonker
Affiliation:
Naval Research Laboratory, Washington, DC 20375-5320
Get access

Abstract

We observed the coexistence of two types of ordered structures, Cu3Au and CuPt, in Zn0.4Fe0.6Se epilayers grown on ZnSe buffer layers on (001) GaAs substrates by transmission electron microscopy. In addition, the Cu3Au ordered structure exists with a multi-faceted domain shape. Energy dispersive x-ray spectra from these domains showed higher Fe concentration than in the disordered matrix. However, in Zn0.5Fe0.5Se epilayers, we only observed CuAu-I ordered multi-faceted domains. The samples with relatively high Fe concentration (x ≈0.6) also showed domains of FeSe with a hexagonal structure with triangular form coexisting with Cu3Au ordered domains. Strain-induced interdiffusion takes place between the buffer layer and the epilayer as evidenced by a rough interface between the alloy and the buffer layer.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[11 Kuan, T. S., Kuech, T. F., Wang, W. I., and Wilkie, E.L., Phys. Rev. Lett. 54, 201 (1985).Google Scholar
[2] Stringfellow, G. B., J. Cryst. Growth 98, 108 (1989)Google Scholar
[3] Salamanca-Riba, L., Partin, D. L., and Heremans, J., J. Appl. Phys. 63, 1504 (1988).Google Scholar
[4] Ourmazd, A., and Bean, J. C., Phys. Rev. Lett. 55, 765 (1985).Google Scholar
[5] Park, K., Salamanca-Riba, L., Jonker, B. T., Appl. Phys. Lett. 61, 2302 (1992).Google Scholar
[6] Srivastava, G. P., Martins, J. L., and Zunger, A., Phys. Rev. B 31, 2561 (1985)Google Scholar
[7] Kuan, T. S., Kuech, T. F., Wang, W. I., and Wilkie, E. L., Appl. Phys. Lett. 51, 505 (1987).Google Scholar
[8] Jen, H. R., Jou, M. J., Cherng, Y.T., and Stringfellow, G. B., J. Cryst. Growth 85, 175 (1987).Google Scholar
[9] Gomoyo, A., Suzuki, T., and Iijima, S., Phys. Rev. Lett. 60, 2645 (1988).Google Scholar
[10] Jen, H. R., Ma, K. Y., and Stringfellow, G. B., Appl. Phys. Lett. 54, 1154 (1989).Google Scholar
[11] Kondow, M., Kakibayashi, H., and Minagawa, S., Phys. Rev. B 40, 1159 (1989).Google Scholar
[12] Shahid, M. A., Mahajan, S., Laughlin, D. E., and Cox, H. M., Phys. Rev. Lett. 58, 2567 (1987).Google Scholar
[13] Ueda, O., Fujii, T., Nakada, Y., Yamada, H., and Umebu, J., J. Cryst. Growth 95, 38 (1989).Google Scholar
[14] Park, K., Wei, H. Y., Salamanca-Riba, L., Jonker, B. T., Mat. Res. Soc. Symp. Proc. 312, 213 (1993).Google Scholar
[15] Jonker, B. T., Krebs, J. J., Prinz, G. A., Liu, X., Petrou, A., and Salamanca-Young(Riba), L., Mat. Res. Soc. Symp. Proc 151, 151 (1989).Google Scholar
[16] Lu, Z. W., Wei, S.-H., and Zunger, A., Phys. Rev. B 45, 10314 (1992).Google Scholar
[17] Os'orio, R., Bernard, J. E., Froyen, S., and Zunger, A., Phys. Rev. B, 45, 173 (1992).Google Scholar
[18] Froyen, Sverre and Zunger, Alex, Phys. Rev. Lett. 66, 2132 (1991).Google Scholar
[19] Data selected from Brown, A. M. and Ashby, M. F., ’Correlations for Diffusion Constants’, Acta Metallurgica, 28, 1085 (1980).Google Scholar
[20] Tu, K.-N., Mayer, J. W., Feldman, L. C., in Electronic Thin Film Science For Electrical Engineers and Materials Scientists, (Macmillan Publishing Co., N. Y, 1992) p.164 Google Scholar
[21] Spaepen, F., Mat. Res. Soc. Symp. Proc. 37, 294 (1985).Google Scholar