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Observation and Characterization of Electric Fields at Grain Boundaries

Published online by Cambridge University Press:  15 February 2011

B. D. Huey ,
D. A. Bonnell  and
D. L. Carroll
B. D. Huey
Affiliation:
Department of Materials Science, University of Pennsylvania, Philadelphia, PA
D. A. Bonnell
Affiliation:
Department of Materials Science, University of Pennsylvania, Philadelphia, PA
D. L. Carroll
Affiliation:
Department of Materials Science, University of Pennsylvania, Philadelphia, PA
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Abstract

Variations in local electric fields near individual grain boundaries have been observed in TiO2 with an ac, non-contact, atomic force microscopy detection scheme. A lateral, in-plane bias was applied to the sample inducing an electric field gradient. A modified AFM then allowed accurate force and force gradient images of both topography and the electric fields to be measured. The sample-tip separation and bias dependence of the AFM probe response to electrostatic fields are used to derive the relationships that allow quantification of lateral fields. With this technique, observation and quantification of potential barriers and enhancement and depletion widths may be observed, especially as a function of boundary chemistry and orientation. Results are discussed in terms of interface potential barrier models.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 357: Symposium C – Structure and Properties of Interfaces in Ceramics , 1994 , 401
Copyright
Copyright © Materials Research Society 1995

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References

1. Pike, G.E., Seager, C.H., Advances in Ceramics, Volume 1, Grain Boundary Phenomena in Electronic Ceramics, (1981).Google Scholar
2. Surfaces and Interfaces in Ceramic and Ceramic-Metal Systems, ed. Pask, J.A. and Evans, A.G., Plenum Press, NY, (1980).Google Scholar
3. Grain Boundary Structure and Related Phenomenon, Proceedings of the 4th Japan Institute of Metals International Symposium, Trans. of J.I.M., Vol. 27 (1986).Google Scholar
4. Olsonn, E., Dunlop, G.L., The role of Interfacial Microstructure in ZnO Varistor Materials, Ceramic Microstructures '86: Role of Interfaces, ed. Pask, J.A., Evans, A.G., Plenum Press, NY, (1987) 657–64.Google Scholar
5. Pike, G.E., Seager, C.H., J Appl. Phys. 50 (5), (1979) 3414–3422.Google Scholar
6. Seager, C., Pike, G. Appl. Phys. Lettt. 35, (1979) 709.Google Scholar
7. Sun, H., Ahang, L., Yao, X., J. Am. Cer. Soc. 76 [5[, (1993) 1150.Google Scholar
8. Digital Instruments Nanoscope IIIGoogle Scholar
9. Martin, Y., Williams, C. C., Wickramasinghe, H.K., J. Appl. Phys 61, (1987) 4723.Google Scholar
10. Handwerker, C.A., Dynys, J.M., Cannon, R.M., Coble, R.L., J. Am. Ceram. Soc. 73 [5], (1990) 1371–77.Google Scholar
11. Chiang, Y.M., Takagi, T., J. Am. Cer. Soc., 73 [11], (1990) 3278–91.Google Scholar
12. Deshu, S.B., Payne, D. A., J. Am. Cer. Soc., 73 [11], (1990) 3391–97.Google Scholar
13. Yan, M.F., Cannon, R. M., Bowen, H.K., J. Appl. Phys., 54 [2], (1983) 764–68.Google Scholar
14. Mayer, J.W., Lau, S.S., Electronic Materials Science, MacMillan Publishing Company, NY (1990).Google Scholar