Hostname: page-component-848d4c4894-2xdlg Total loading time: 0 Render date: 2024-07-01T17:56:43.612Z Has data issue: false hasContentIssue false

Nuclear Magnetic Resonance Studies of Hydrogen in Amorphous Silicon

Published online by Cambridge University Press:  10 February 2011

R. E. Norberg
Affiliation:
Department of Physics, Washington University, One Brookings Drive, St. Louis, MO 63130, ren@howdy.wustl.edu
P. A. Fedders
Affiliation:
Department of Physics, Washington University, One Brookings Drive, St. Louis, MO 63130, ren@howdy.wustl.edu
D. J. Leopold
Affiliation:
Department of Physics, Washington University, One Brookings Drive, St. Louis, MO 63130, ren@howdy.wustl.edu
Get access

Abstract

Proton and deuteron NMR in hydrogenated amorphous silicon yield quantitative measures of species-specific structural configurations and their dynamics. Populations of silicon-bonded and molecular hydrogens correlate with photovoltaic quality, doping, illumination/dark anneal sequences, and with infrared and other characterizations. High quality films contain substantial populations of nanovoid-trapped molecular hydrogen.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chan, P. H., Ph.D. Thesis, Washington University, September 1993 (unpublished).Google Scholar
2. Kim, Y. W., Ph. D. Thesis, Washington University, November 1991 (unpublished).Google Scholar
3. Bork, V. P., Fedders, P. A., Leopold, D. J., Norberg, R. E., Boyce, J. B., and Knights, J. C., Phys. Rev. B 36, 9351 (1987).Google Scholar
4. Kernan, M. J., Ph. D. Thesis, Washington University, 1996 (unpublished).Google Scholar
5. Kernan, M. J., Corey, R. L., Fedders, P. A., Leopold, D. J., Norberg, R. E., Turner, W. A., and Paul, W., Mat. Res. Soc. Symp. Proc. 377, 395 (1995).Google Scholar
6. Boyce, J. B. and Stutzmann, M., Phys. Rev. Lett. 54, 562 (1985).Google Scholar