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New Techniques for Synchrotron Powder Diffraction Studies

Published online by Cambridge University Press:  15 February 2011

G. S. Knapp ,
M. A. Beno ,
G. Jennings  and
M. Ramanathan
G. S. Knapp
Affiliation:
Material Sciences Division, Argonne National Laboratory, Argonne IL 60439
M. A. Beno
Affiliation:
Material Sciences Division, Argonne National Laboratory, Argonne IL 60439
G. Jennings
Affiliation:
Material Sciences Division, Argonne National Laboratory, Argonne IL 60439
M. Ramanathan
Affiliation:
Material Sciences Division, Argonne National Laboratory, Argonne IL 60439
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Abstract

This manuscript discusses two different powder diffraction methods which possess high resolution, low background and very high counting rates. Both methods utilize analyzer crystals in combination with position sensitive detectors. The first method uses a curved perfect crystal analyzer diffracting in the scattering plane to diffract a range of angles into the position sensitive detector. The second method is somewhat simpler, it uses a graphite analyzer crystal diffracting out of the scattering plane. Applications of these methods to anomalous scattering from both powder and amorphous materials are also discussed. One of the techniques should also be very useful for small angle scattering.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 317
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

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