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New Dendritic Materials as Potential OLED Transport and Emitter Moeities

Published online by Cambridge University Press:  14 March 2011

Asanga B. Padmaperuma ,
Greg Schmett ,
Daniel Fogarty ,
Nancy Washton ,
Sanjini Nanayakkara ,
Linda Sapochak ,
Kimba Ashworth ,
Luis Madrigal ,
Benjamin Reeves  and
Charles W. Spangler
Asanga B. Padmaperuma
Affiliation:
Department of Chemistry, University of Nevada, Las Vegas, Las Vegas, Nevada 89154-4003, USA
Greg Schmett
Affiliation:
Department of Chemistry, University of Nevada, Las Vegas, Las Vegas, Nevada 89154-4003, USA
Daniel Fogarty
Affiliation:
Department of Chemistry, University of Nevada, Las Vegas, Las Vegas, Nevada 89154-4003, USA
Nancy Washton
Affiliation:
Department of Chemistry, University of Nevada, Las Vegas, Las Vegas, Nevada 89154-4003, USA
Sanjini Nanayakkara
Affiliation:
Department of Chemistry, University of Nevada, Las Vegas, Las Vegas, Nevada 89154-4003, USA
Linda Sapochak
Affiliation:
Department of Chemistry, University of Nevada, Las Vegas, Las Vegas, Nevada 89154-4003, USA
Kimba Ashworth
Affiliation:
Department of Chemistry and Biochemistry, Montana State University, Bozeman, MT 59717, USA
Luis Madrigal
Affiliation:
Department of Chemistry and Biochemistry, Montana State University, Bozeman, MT 59717, USA
Benjamin Reeves
Affiliation:
Department of Chemistry and Biochemistry, Montana State University, Bozeman, MT 59717, USA
Charles W. Spangler
Affiliation:
Department of Chemistry and Biochemistry, Montana State University, Bozeman, MT 59717, USA
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Extract

Traditionally, organic light-emitting devices (OLEDs) are prepared with discrete layers for hole and electron transport. Different materials must be used for these layers because most materials will preferentially transport one charge carrier more efficiently than the other. In most cases, the emitter material serves a dual purpose as both the emitter and the hole or electron transporter. One of the major failure modes of OLEDs results from thermal instabilities of the insulating organic layers caused by joule heating during device operation. The problem is most pronounced for the hole transporting layer (HTL) material which are usually tertiary aromatic amines (i.e., TPD and NPD). This has been attributed to the relatively lower glass transition temperatures (Tg) and resulting inferior thermal stabilities compared to the other materials making up the device. Many researchers have produced HTL materials with higher Tgs based on tertiary aromatic amine oligomers and starburst compounds. Starburst or model dendritic materials offer the advantages of high thermal stabilities and multi-functionality.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 621: Symposia Q/R – Electron-Emissive Materials, Vacuum Microelectronics… , 2000 , Q3.9.1
Copyright
Copyright © Materials Research Society 2000

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References

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