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Near field Optical second Harmonic Imaging of the Polydomain Structure of Epitaxial PbZrxTi1−xO3 thin films

Published online by Cambridge University Press:  21 March 2011

H.Y. Liang ,
I.I. Smolyaninov ,
C.H. Lee ,
C.C. Davis ,
V. Nagarajan  and
R. Ramesh
H.Y. Liang
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
I.I. Smolyaninov
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
C.H. Lee
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
C.C. Davis
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
V. Nagarajan
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742, USA
R. Ramesh
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742, USA
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Abstract

Near field optical second harmonic microscopy has been applied to imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1−xO3 thin films in the 0<x<0.4 range. An uncoated adiabatically tapered fiber tip was employed in our microscope which, according to our previous research [5] could yeild a resolution of up to 80 nm. Experimentally measured nearfield second harmonic images have been compared with the results of theoretical calculations. Good agreement between theory and experiment has been demonstrated. Thus, novel optical technique for nanometer scale ferroelectric domain imaging has been developed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 655 , 2000 , CC8.9.1
Copyright
Copyright © Materials Research Society 2001

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