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Nanoindentation of Lead Free Solders for Harsh Environments

Published online by Cambridge University Press:  01 February 2011

Vitor Farinha Marques
Affiliation:
vitor.marques@materials.ox.ac.uk, University of Oxford, Department of Materials, Begbroke Business and Science Park, Sandy Lane, Yarnton, OX5-1PF, Oxford, N/A, United Kingdom
Patrick Grant
Affiliation:
patrick.grant@materials.ox.ac.uk, University of Oxford, Department of Materials, Oxford, OX5 1PF, United Kingdom
Colin Johnston
Affiliation:
colin.johnston@materials.ox.ac.uk, University of Oxford, Department of Materials, Oxford, OX5 1PF, United Kingdom
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Abstract

To better understand the factors governing the reliability of lead free solders during severe excursions in temperature, the hardness and elastic modulus of the micro-phases formed in a Sn-Ag-Cu/Cu solder joint were characterized using nanoindentation at temperatures from 25 to 175°C. The creep behaviour of the different micro-phases was also studied as function of temperature. The hardness and elastic modulus of Cu6Sn5, Cu3Sn had a weak dependence on temperature, while primary Sn, eutectic regions and electroplated Cu hardness and modulus were sensitive to temperature. Creep studies indicated that intermetallic were more creep resistant than softer phases that readily underwent creep, the type and rate of which was shown to be strongly temperature dependent.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

REFERENCES

[1] Mahmudi, R., Geranmayeh, A.R. and Rezaee-Bazzaz, A., Mater. Sci. Eng. A 448, (2007) 287293 Google Scholar
[2] Shapiro, Andrew A., Bonner, J. Kirk, Ogunseitan, Oladele A., Saphores, Jean-Daniel M., and Schoenung, Julie M., IEEE Transactions 29, (2006) 6070 Google Scholar
[3] Park, Tae-Sang, Lee, Soon-Bok, J. Electron. Packag. 127, (2005) 237244 Google Scholar
[4] Chromik, R.R., Vinci, R.P., Allen, S.L., Not, M.R., J. Mater. Res. 18, (2003), 25512661 Google Scholar
[5] Deng, X., Chawla, N., Chawla, K.K., Koopman, M., Acta Mater 52, (2004) 42914303 Google Scholar
[6] Goodall, R., Clyne, T.W., Acta Mater. 54, (2006), 54895499 Google Scholar
[7] Beake, B.D., Smith, J.F., Philos. Mag. A 82, (2003) 21792186 Google Scholar
[8] Oliver, W.C. and Pharr, G.M., J. Mater. Res. 7 (1992). 15641580 Google Scholar
[9] Neville, Alex A. Moody, R., , William and Gerberich, W., J. Mater. Res. 19, (2004) 26502657 Google Scholar
[10] Laurila, T., Vuorinen, V., Kivilahti, J.K., Mater. Sci. Eng R 49, (2005) 160 Google Scholar
[11] Sherby, O.D.: In Nature and Properties of Materials: An Atomistic Interpretation, edited by Pask, J. (Wiley, New York, 1967) 376 Google Scholar
[12] Chang, Shou-Yi, Lee, Yu-Shuien, Chang, Ting-Kui, Mater Sci. Eng A 423 (2006) 5256 Google Scholar
[13] Rhee, H., Lucas, J.P., Subramanian, K.N., J. Mater. Sci. 13, (2002) 477484 Google Scholar
[14] Huang, M.L., Wang, L., Wu, C.M.L., J. Mater. Res. 17, (2002) 28972903 Google Scholar
[15] Dutta, I., Park, C., Choi, S., Mater Sci. Eng A 379, (2004) 401410 Google Scholar
[16] Chromik, R.R., Wang, D-N., Shugar, A., Limata, L., Notis, M.R., Vinci, R.P., J. Mater. Res. 20, 8, (2005)21612172 Google Scholar
[17] Kerr, M., Chawla, N., Acta Mater. 52, (2004) 45274535 Google Scholar