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Morphology Characterization in Multicomponent Polymer Systems using Scanning Probe Microscopy

Published online by Cambridge University Press:  10 February 2011

Ravi Viswanathan
Affiliation:
Raychem Corporation, Menlo Park, CA 94025
Jing Tian
Affiliation:
Raychem Corporation, Menlo Park, CA 94025
David W.M. Marr
Affiliation:
Chemical Engineering and Petroleum Refining Department, Colorado School of Mines, Golden, CO 80401
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Abstract

A newly available scanning probe microscopy, phase imaging, has been used to image polyethylene (PE) blends and composites. By providing not only a topographical map of the surface but also information on material properties, this technique has allowed ready identification of individual components within the mixtures investigated.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1 Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. Phys. Rev. Lett. 1982, 49, 57.Google Scholar
2 Binnig, G.; Quate, C.F.; Gerber, Ch. Phys. Rev. Lett. 1986, 56, 930.Google Scholar
3 Ruan, J. A.; Bhushan, B. Trans. ASME, J. Tribol. (USA) 1994, 116, 378.Google Scholar
4 Huber, CA.; Huber, T.E.; Sadoqi, M.; Lubin, J.A.; Manalis, S.; Prater, C.B. Science 1994, 263, 800.Google Scholar
5 Viswanathan, R.; Heaney, M.B. Phys. Rev. Lett. 1996, 75, 4433.Google Scholar
6 Grutter, P. MSA Bull. 1994, 24, 416.Google Scholar
7 Maivald, P.; Butt, HJ.; Gould, S.A.C.; Prater, C.B.; Drake, B.; Gurley, J.A.; Elings, V.B.; Hansma, P.K. Nanotechnology 1991, 2, 103.Google Scholar
8 Radmacher, M.; Tillmarm, R.W.; Gaub, H.W. Biophys. J. 1993, 64, 735.Google Scholar
9 Babcock, K.L.; Prater, C.B. Application Notes -- “Phase Imaging - Beyond Topography” Digital Instruments, Santa Barbara, CA.Google Scholar
10 Digital Instruments, Santa Barbara, CA.Google Scholar