Hostname: page-component-8448b6f56d-c4f8m Total loading time: 0 Render date: 2024-04-19T19:44:22.773Z Has data issue: false hasContentIssue false

Morphological changes of Branched Ge Clusters caused by Diffusion Fields and Surface Roughness of Au Underlayer

Published online by Cambridge University Press:  10 February 2011

A. Sugawara
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
T. Kikukawa
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
Y. Haga
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
O. Nittono
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
Get access

Abstract

The formation of polycrystalline Ge clusters, during annealing of amorphous Ge/polycrystalline Au bilayers, has been studied by in-situ transmission and scanning electron microscopy. The experimentally observed generation of branching patterns, and the evolution mechanism of branches, are discussed on the basis of finite diffusion length aggregation simulations.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Sugawara, A., Kikukawa, T. and Nittono, O., Mat. Sci. Eng., 179, 355, (1994).Google Scholar
[2] Hou, J. q. and Wu, Z. q., Phys. Rev., B40, 1008 (1989).Google Scholar
[3] Duan, J. Z. and Wu, Z. Q., Sol. Stat. Comm., 65, 7 (1988).Google Scholar
[4] Mullins, W. W. and Sekerka, R. F., J. Appl. Phys., 34,323 (1963).Google Scholar
[5] Ball, R. C. and Witten, T. A., Phys. Rev. A29, 2966, (1982)Google Scholar
[6] Sugawara, A., Kikukawa, T. and Nittono, O., Proceedings of 14th International Conference on Electron Microscopy (1994, Paris, France) p467.Google Scholar
[7] Smith, R. L. and Collons, R. D., Phys. Rev., A39, 5409, (1989)Google Scholar
[8] “Numerical Recipes in Pascal”, ed. Press, William H., Cambridge University Press, Cambridge, 1989.Google Scholar
[9] Family, F. and Vicsek, T., Computer Phys. p44(1990).Google Scholar
[10] Roder, H., Hahn, E., Brune, H., Bucher, J. P. and Kern, K., Nature, 366, 141, (1993).Google Scholar