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Modelling of The Intramolecular Structure Of Monolayer C60 Molecules Observed with Scanning Tunneling Microscopy

Published online by Cambridge University Press:  28 February 2011

T. Chen
Affiliation:
Laboratory for Scanning Tip MicroscopyOptical Sciences CenterUniversity of Arizona, Tucson AZ 85721
S. Howells
Affiliation:
Laboratory for Scanning Tip MicroscopyOptical Sciences CenterUniversity of Arizona, Tucson AZ 85721
M. Gallagher
Affiliation:
Laboratory for Scanning Tip MicroscopyOptical Sciences CenterUniversity of Arizona, Tucson AZ 85721
L. Yi
Affiliation:
Laboratory for Scanning Tip MicroscopyOptical Sciences CenterUniversity of Arizona, Tucson AZ 85721
D. Sarid
Affiliation:
Laboratory for Scanning Tip MicroscopyOptical Sciences CenterUniversity of Arizona, Tucson AZ 85721
D. L. Lichtenberger
Affiliation:
Laboratory for Electron Spectroscopy and Surface AnalysisDepartment of ChemistryUniversity of Arizona, Tucson AZ 85721
K. W. Nebesny
Affiliation:
Laboratory for Electron Spectroscopy and Surface AnalysisDepartment of ChemistryUniversity of Arizona, Tucson AZ 85721
C. D. Ray
Affiliation:
Laboratory for Electron Spectroscopy and Surface AnalysisDepartment of ChemistryUniversity of Arizona, Tucson AZ 85721
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Abstract

Images of monolayer coverages of C60 on gold substrates, using scanning tunneling microscopy, reveal intermolecular arrangement and intramolecular features. In this paper we concentrate on the interpretation of these internal features, present a model showing that they arise from local charge density variations of high-lying π orbitals on approximately every other carbon atom, and discuss also other possible mechanisms for this effect.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Rohlfing, E. A., Cox, D. M., Kaldor, A. J., J. Chem Phys. 81 3322 (1984).CrossRefGoogle Scholar
2. Kroto, W. H., Heath, J. R., O’Brien, S. C., Curl, R. F., Smalley, R. E., Nature 318, 162 (1985).Google Scholar
3. Zhang, Q. L. et al. J. Phys. Chem. 90, 525 (1986).Google Scholar
4. Liu, Y. et al. Chem. Phys. Lett. 126, 215 (1986).Google Scholar
5. Kratschmer, W., Lamb, L. D., Fostiropoulos, K. and Huffman, D. R., Nature, 347, 354 (1990).Google Scholar
6. Ajie, H., Alvarez, M. M., Anz, S. J., Beck, R. D., Diederich, F., Fostiropoulos, K., Huffman, D. R., Krätschmer, W., Rubin, Y., Schriver, K. E., Sensharma, D., and Whetten, R. L., J. Phys. Chem. 94, 8630 (1990).Google Scholar
7. Duncan, M. A. and Rouvray, D. H., Scientific American, 261, 110 (Dec. 1989).Google Scholar
8. Fowler, P. W., Lazzeretti, P., and Zanasi, R., Chem. Phys. Lett. 165, 79 (1990).CrossRefGoogle Scholar
9. Haufler, R. E. et al., J. Phys. Chem. (in Press, 1990).Google Scholar
10. Weeks, D. E. and Harter, W. G., J. Chem. Phys. 90, 4744 (1989).Google Scholar
11. Kroto, W. H., Science 242, 1139 (1988).Google Scholar
12. Huffman, D. R. (private communication).Google Scholar
13. Lichtenberger, D. L., Nebesny, K. W. and Ray, C. D., Huffman, D. R. and Lamb, L. D., (in press, Chem. Phys. Lett, 1990).Google Scholar
14. Sarid, Dror, Scanning Force Microscopy, Oxford University Press, 1991, and references therein.Google Scholar
15. Commercially available from Digital Instruments, Inc., 6780 Cortona Drive, Santa Barbara, California 93117.Google Scholar
16. Chen, T.. Howells, S., Gallagher, M., Yi, L., Sarid, D., Lichtenberger, D. L., Nebesny, K. W. and Ray, C. D., (submitted to Phys. Rev. Lett., 1990)Google Scholar
17. Taylor, R., Hare, J. P., Abdul, A. K., and Kroto, H. W., Chem. Commun. (in press, 1990).Google Scholar
18. Lichtenberger, D. et al. (unpublished)Google Scholar
19. See, for example, van Loenen, E. J., Dijkkamp, D., Hovenen, A. J., Lenssinck, J. M., and Dieleman, J., Appl. Phys. Lett. 56, 1755 (1990).Google Scholar
20. Tersoff, J. and Lang, N. D., Phys. Rev. Lett. 65, 1132 (1990) and references therein.CrossRefGoogle Scholar
21. Chen, T., Howells, S., Gallagher, M., Yi, L., and Sarid, D. (unpublished).Google Scholar
22. Chen, C. J.. J. Vac. Sci. Technol. A 6, 319 (1988).Google Scholar