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Modelling of CW Laser Annealing of Multilayer Structures
Published online by Cambridge University Press: 15 February 2011
Abstract
A thermal model is developed for cw laser annealing of multilayer structures. Each layer has arbitrary thickness, thermal conductivity and optical properties. Steady state conditions with no phase transition are assumed. A procedure is presented for obtaining the temperature distribution in any system and explicit integral expressions are developed for the two and three layer cases. Results are calculated for the Si/glass and Si/SiO2 /Si systems.
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- Copyright © Materials Research Society 1982