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Modeling of Hysteresis Properties of Lead Zirconate Titanate Thin Films

Published online by Cambridge University Press:  25 February 2011

In K. Yoo  and
Seshu B. Desu
In K. Yoo
Affiliation:
Department of Materials EngineeringCollege of Engineering, Virginia Polytechnic Institute and State University, Blacksbur, VA 24061
Seshu B. Desu
Affiliation:
Department of Materials EngineeringCollege of Engineering, Virginia Polytechnic Institute and State University, Blacksbur, VA 24061
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Abstract

It is proposed that the polarization reversal mechanism in ferroelectric ceramics such as titanates is controlled by nucleation, growth, merging and shrinkage of ferroelectric domains. These domain phenomena are in turn determined by the nature of Barkhausen jumps, internal electric field, and dielectric relaxation times of the dipoles. Based on the proposed polarization reversal mechanism, a quantitative model was developed for simulating the hysteresis properties of lead zirconate titanate (PZT) thin films. The simulated hysteresis loops are in good agreement with the experimental results.

It was observed that dielectric viscosity, which is very useful in understanding fatigue and aging behavior of PZT thin films, is one of the key parameters that controls the hysteresis properties.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 243: Symposium G – Ferroelectric Thin Films II , 1991 , 329
Copyright
Copyright © Materials Research Society 1992

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