Hostname: page-component-848d4c4894-8bljj Total loading time: 0 Render date: 2024-06-17T10:29:24.847Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure and Properties of Mixed Yba2Cu3O7-X and Y2Ba4Cu8O16 Thin Films

Published online by Cambridge University Press:  28 February 2011

A.F. Marshall ,
A. Kapitulnik ,
K. Char  and
R.W. Barton
A.F. Marshall
Affiliation:
Center for Materials Research and Dept. of Applied Physics, Stanford University, Stanford, CA 94305
A. Kapitulnik
Affiliation:
Center for Materials Research and Dept. of Applied Physics, Stanford University, Stanford, CA 94305
K. Char
Affiliation:
Conductus, Inc., Sunnyvale, CA 94086
R.W. Barton
Affiliation:
Conductus, Inc., Sunnyvale, CA 94086
Get access

Abstract

Post-annealed thin films comprised of mixed YBa2Cu3O7-x (123) and Y2Ba4Cu8O16 (248) phases with both faulted and unfaulted microstructures have been characterized by planar and cross-section transmission electron microscopy. The influence of 248-type faults on the 123 structure, possible mechanisms for the higher Tc's of faulted films, and observations of a fourfold ordered structure are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 785
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Zandbergen, H.W., Gronsky, R., and Thomas, G., Phys. Status Solidi (a) 105, 207 (1988).Google Scholar
2 Marshall, A.F., Barton, R.W., Char, K., Kapitulnik, A., Oh, B., Hammond, R.H., and Laderman, S.S., Phys. Rev. B, 37, 9353 (1988).Google Scholar
3 Char, K., Phys. Rev. B, 38, 834 (1988). -Google Scholar
4 Marsh, P. Fleming, R.M., Mandich, M.L., DeSantolo, A.M., Kwo, J., Hong, M., and Martinez-Miranda, L.J., Nature, 334, 141 (1988).Google Scholar
5 Bordet, P., Chaillout, C., Chenavas, J., Hodeau, J.L., Marezio, M., Karpinski, J., and Kaldis, E., Nature, 334, 596 (1988).Google Scholar
6 Ramesh, R., Hwang, D.M., Nazar, L., Ravi, R.S., Inam, A., Wu, X.D., Dutta, B., Venkatesan, T., Thomas, G., Marshall, A.F., and Geballe, T.H., Science, in press (1989).Google Scholar
7 Ourmazd, A., Rentschler, J.A., Spence, J.C.H., O'Keefe, M., Graham, R.J., Johnson, D.W., and Rhodes, W.W., Nature, 327, 308 (1987).Google Scholar
8 McElfresh, M. W., Maple, M.B., Yang, K.N., and Fisk, Z, Appl. Phys. A, 45, 365 (1988).Google Scholar