Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-06-28T14:46:07.585Z Has data issue: false hasContentIssue false
  • English
  • Français

Microscopic Techniques for Characterization of Magnetic Layers

Published online by Cambridge University Press:  10 February 2011

N. Meyendorf ,
I. Altpeter ,
U. Netzelmann ,
J. Hoffmann ,
W. Nichtlpecher  and
H. Grimm
N. Meyendorf
Affiliation:
Fraunhofer Institute Nondestructive Testing, University 37, 66123 Saarbruecken, Germany
I. Altpeter
Affiliation:
Fraunhofer Institute Nondestructive Testing, University 37, 66123 Saarbruecken, Germany
U. Netzelmann
Affiliation:
Fraunhofer Institute Nondestructive Testing, University 37, 66123 Saarbruecken, Germany
J. Hoffmann
Affiliation:
Center for Materials Diagnostics, University of Dayton, Dayton OH 45469-0121
W. Nichtlpecher
Affiliation:
Exabyte Magnetics, Nuernberg, Germany
H. Grimm
Affiliation:
IBM, Mainz, Germany
Get access

Abstract

In recent years increasing interest in magnetic materials especially amorphous and nano crystalline layers has arised. Due to the magnetostrictive and magnetoresistive properties magnetic materials obtained high importance in sensor, actuator and memory applications. Therefore new methods to characterize magnetic and mechanical properties of magnetic materials are required. Two new microscopic techniques will be presented in this paper.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999 , 145
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Hubert, A., Schäfer, R., Magnetic domains, Springer-Verlag, Berlin (1998)Google Scholar
2.Hoppstädter, D. and Netzelmann, U., Imaging of magnetic surfaces by detection of photothermally modulated stray fields, Journal de Physique IV, C7659–662 (1994)Google Scholar
3.Netzelmann, U., Untersuchungen laserstrahlmodulierter magnetischer Streufelder zur Charakterisierung ferromagnetischer Werkstoffoberflächen und Schichten, (FhG-IzfP Final report No. 990405-TW, Saarbrücken 1999)Google Scholar
4.Bender, J., Barkhausen Noise and Eddy Current Microscopy (BEMI): Microscope Configuration, Probes and Imaging Characteristics in ‘Review of Progress in Quantitative Nondestructive Evaluation’, Vol. 16, edited by Thompson, D. O. and Chimenti, D. E., (Plenum Press, New York, 1997), p. 2121ff.Google Scholar
5.Altpeter, I., Dobmann, G., Faßbender, S., Hoffmann, J., Johnson, J., Meyendorf, N. and Nichtl-Pecher, W., Detection of residual stresses and nodular growth in thin ferromagnetic layers with Barkhausen and acoustic microscopy in ‘Nondestructive Characterization of Material VIII’, edited by Green, Robert E. Jr. (Plenum Press, New York, 1998), p. 677ff.Google Scholar
6.Altpeter, I. and Theiner, W., Device for spatially resolved and nondestructive inspection of magnetic parameters, European Patent EP No. 0595 117 B 1Google Scholar
7.Wang, J., Recktenwald, T., Maisl, U., and Netzelmann, U., Observation of magnetic structures under external fields by the photothermally modulated stray field technique in: ‘Photoacoustic and Photothermal Phenomena, Tenth International Conference, Rome, Italy, August 1998’, Scudieri, F. and Bertolotti, M. (eds.), AIP Conference Proceedings 463 (American Institute of Physics, Woodbury NY 1999) 380–382Google Scholar
8.Altpeter, I., Bender, J., Hoffmann, J., Kopp, M. and Rouget, D., Characterisierung von Struktur und Eigenschaften ferromagnetischer Schichten als Voraussetzung fur die Optimierung und Weiterentwicklung von Systemen zur Datenaufzeichnung, (Final Report BMBFVerbundvorhaben, No. 03N80003 B7)Google Scholar