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Measuring the Dielectric Properties of Nanostructures using Optical Reflection and Transmission: Bismuth Nanowires in Porous Alumina

Published online by Cambridge University Press:  21 February 2011

M. R. Black
Affiliation:
Department of EECS, Massachusetts Institute of Technology, Cambridge, MA
Y. M. Lin
Affiliation:
Department of EECS, Massachusetts Institute of Technology, Cambridge, MA
M. S. Dresselhaus
Affiliation:
Department of EECS, Massachusetts Institute of Technology, Cambridge, MA Department of Physics, Massachusetts Institute of Technology, Cambridge, MA
M. Tachibama
Affiliation:
Department of Physics, Pennsylvania State University, State College, PA
S. Fang
Affiliation:
Department of Physics and Astronomy, University of Kentucky, Lexington, KY
O. Rabin
Affiliation:
Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA
F. Ragot
Affiliation:
Department of Materials Science, UCLA, Los Angeles, A
P. C. Eklund
Affiliation:
Department of Physics, Pennsylvania State University, State College, PA
Bruce Dunn
Affiliation:
Department of Materials Science, UCLA, Los Angeles, A
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Abstract

This paper develops a method to deduce the dielectric function of nanostructures smaller than the chosen wavelength of light. It modifies the Maxwell - Garnett Effective Medium Theory equations to calculate the dielectric function of a metal embedded inside a dielectric. Specifically, reflection and transmission measurements of an array of bismuth nanowires in an anodized porous alumina template are used to calculate the frequency - dependent di-electric function of the nanowires. The spectra are taken using Fourier transform infrared spectroscopy covering the 500 to 4000 cm−1 frequency range. These data are used to determine the real and imaginary parts of the dielectric function of the composite materials. Next, the percentage of the total volume occupied by either Bi or air in the porous alumina (the “filling factor”) was found by scanning electron microscopy. The modified Maxwell-Garnett (M-G) equations specify how to use the filling factor and the dielectric function of the composite material to calculate the dielectric function of the alumina. Finally, the modified M-G equations are used a second time to calculate the dielectric function of Bi nanowires using the dielectric function of alumina, the dielectric function of the filled template, and the filling factor. The resulting dielectric function of Bi nanowires is then compared to theoretical predictions.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

[1] Aspnes, D. E., Thin Solid Films 89, 249262 (1982).Google Scholar
[2] Aspnes, D. E., Heller, A., and Porter, J. D., J. Appl. Phys. 60, 30283034 (1986).Google Scholar
[3] Garnett, J. C. Maxwell, Phil. Trans. A. 203, 385420 (1904).Google Scholar
[4] Garnett, J. C. Maxwell, Phil. Trans. A. 205, 237288 (1906).Google Scholar
[5] Foss, Colby A. Jr, Hornyak, Gabor L., Stockert, Jon A., and Martin, Charles R., J. Phys. Chem. 96, 74977499 (1992).Google Scholar
[6] Anderson, A., Hunderi, O., and Granqvist, C. G., J. Appl. Phys. 51, 754764 (1980).Google Scholar
[7] Poborchii, V. V., Jpn. J. Appl. Phys. 34, 271274 (1995).Google Scholar
[8] Sen, P. N., Scala, C., and Cohen, M. H., Geophysics 46, 781795 (1981).Google Scholar
[9] Kreibig, U., Althoff, A., and Pressmann, H., Surface Science 106, 308317 (1991).Google Scholar
[10] Kreibig, U. and Genzel, L., Surface Science 156, 678700 (1985).Google Scholar
[11] Link, S., Mohamed, M. B., and El-Sayed, M.A., J. Phys. Chem. B. 103, 3073– (1999).Google Scholar
[12] Hornyak, Gabor L., Patrissi, Charles J., and Martin, Charles R., J. Phys. Chem. B. 101, 15481555 (1997).Google Scholar
[13] Foss, Colby A. Jr, Hornyak, Gabor L., Stockert, Jon A., and Martin, Charles R., J. Phys. Chem. B. 98, 29632971 (1994).Google Scholar
[14] Granqvist, C. G. and Hunderi, O., Phys. Rev. B. 18, 28972906 (1978).Google Scholar
[15] Zhang, Z., Ying, J., and Dressehaus, M., J. Mater. Res. 13, 17451748 (1998).Google Scholar