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Measuring Fatigue in PZT Thin Films

Published online by Cambridge University Press:  16 February 2011

D. J. Johnson ,
D. T. Amm ,
E. Griswold ,
K. Sreenivas ,
G. Yi  and
M. Sayer
D. J. Johnson
Affiliation:
Physics Department, Queen's University, Kingston, Ontario CANADA K7L 3N6
D. T. Amm
Affiliation:
Physics Department, Queen's University, Kingston, Ontario CANADA K7L 3N6
E. Griswold
Affiliation:
Physics Department, Queen's University, Kingston, Ontario CANADA K7L 3N6
K. Sreenivas
Affiliation:
Physics Department, Queen's University, Kingston, Ontario CANADA K7L 3N6
G. Yi
Affiliation:
Physics Department, Queen's University, Kingston, Ontario CANADA K7L 3N6
M. Sayer
Affiliation:
Physics Department, Queen's University, Kingston, Ontario CANADA K7L 3N6
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Abstract

Small signal dielectric response is reported for a variety of PZT thin film samples. Small and large signal responses, recorded simultaneously during the fatiguing of PZT thin films, are used to identify distinct fatigue mechanisms. Microcracking or electrode delamination less than 100 Å is sufficient to explain the high correlation between the dielectric permittivity and remanent polarization during fatigue.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 200: Symposium Y – Ferroelectric Thin Films I , 1990 , 289
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

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[3] Zhang, Q.M., Pan, W.Y., Jang, S.J. and Cross, L.E., J. Appl. Phys., 64 6445 (1988)Google Scholar
[4] Sayer, M. and Mansingh, A., Non-Crystalline Solids, 3, 1, CRC Press (1987)Google Scholar
[5] Schaffer, W.J. and Mikkola, D.E., J. Appl. Phys., 64, 2563 (1988)Google Scholar